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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note 
Specific to instruments that use the Y-factor method for noise figure measurements, this app note discusses measurement basics, avoidable errors, loss and temperature corrections, and uncertainties.

Application Note 2017-12-01

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-12-01

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Nonlinear Vector Network Analyzer (NVNA) Brochure 
NVNA provides the critical leap in technology to go beyond linear S-parameters, allowing efficient and accurate analysis and design of active devices under real world operating conditions.

Brochure 2017-04-26

PDF PDF 5.12 MB
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements – EMSCAN 
Real-Time Near-Field Cell Phone and Tablet Antenna Measurements from Keysight Technologies and EMSCAN

Solution Brief 2017-04-20

 
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-03-10

PDF PDF 634 KB
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2017-01-24

PDF PDF 2.54 MB
Impedance Measurement Handbook - 6th Edition - Application Note 
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

Signal Analyzers: Keysight EXA vs. Rohde & Schwarz FSV - Competitive Comparison 
This comparison demonstrates the Keysight EXA signal analyzer's superior performance in making sensitivity and noise figure measurements, as compared to the R&S FSV.

Competitive Comparison 2016-05-17

PDF PDF 768 KB
Bluetooth Audio Measurement with the U8903B Performance Audio Analyzer - Application Note 
This article focuses on the Bluetooth audio measurement applications of the U8903B performance audio analyzer. Bluetooth audio is also part of the whole audio measurement and analysis ecosystem.

Application Note 2016-01-28

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note 
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

Application Note 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note 
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2015-07-22

Noise Figure Uncertainty Calculator 
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2015-05-29

 
Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Keysight

Solution Brief 2015-03-26

 
E5052B Signal Source Analyzer - Brochure 
This 16-page brochure describes the features and benefits of the E5052B (10 MHz to 7 GHz, 26.5 GHz, or 110 GHz) Signal Source Analyzer. The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

Brochure 2015-02-25

PDF PDF 1.92 MB
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL 
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL and Keysight.

Solution Brief 2014-08-04

 
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2014-08-03

PDF PDF 175 KB
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note 
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

Spectrum and Signal Analysis Pulsed RF Application Note 150-2 
This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra.

Application Note 2012-07-05

Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3

Feature Story 2010-03-09

 
Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

 
Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process 
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

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