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Fundamentals of Electronic Test & Measurement

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1-25 из 166

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Руководство по применению 2017-09-07

Network Analysis Basics - Applying Error Correction To Network Analyzer Measurements (AN 1287-3) 
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.

Руководство по применению 2017-09-07

8 Hints for Making Bettter Measurements Using RF Signal Generators - Application Note 
This application note provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Руководство по применению 2017-08-17

Medalist i3070 Test Throughput Optimization - Application Note 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Руководство по применению 2017-06-16

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Руководство по применению 2017-02-13

Educational Overview of RF Power Measurement and Applications - Application Note 
RF power measurement is the basic for the study of RF & microwave theories. Understand how RF power meter and sensor works and its applications from the educational perspectives.

Руководство по применению 2016-08-22

Migrating from the 34401A RS-232 Serial Interface to the Truevolt DMM 34461A USB/LAN Interface 
This guide explains how to migrate existing 34401A programs developed for the RS-232 interface for use with the 34461A USB and LAN interfaces.

Обзор технических характеристик 2016-03-18

“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Руководство по применению 2015-07-14

Peak Power Solutions Brochure for Radar and Wireless Applications - Brochure  
This peak power solutions brochure cover various radar & wireless applications. Get a summary of applications in this brochure and learn where to download the application note and videos accordingly.

Брошюра 2015-04-30

Основы анализа спектра - Рекомендации по применению 
В данных рекомендациях по применению разъясняются основы супергетеродинных анализаторов спектра со свипируемой частотой настройки и рассмотрены новейшие достижения в развитии их функциональных возможностей.

Руководство по применению 2015-02-13

Основы измерения коэффициента шума в радиочастотном и микроволновом диапазонах 
В данном Руководстве приведены основные сведения по измерениям коэффициента шума в ВЧ и СВЧ диапазонах. Рассматриваются понятия коэффициента шума и шумовой температуры, а также шумовые характеристики двухпортовых цепей и измерение коэффициента шума.

Руководство по применению 2014-08-02

Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Руководство по применению 2014-08-01

Точные измерения интермодуляционных искажений с помощью анализатора цепей серии PNA-X 
В данном документе рассматриваются методы обеспечения точности двухтональных измерений интермодуляционных искажений при использовании СВЧ-анализатора цепей PNA-X

Руководство по применению 2014-07-31

Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Руководство по применению 2014-07-31

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Руководство по применению 2011-03-28

Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Руководство по применению 2010-03-15

PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Руководство по применению 2009-11-24

Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Руководство по применению 2009-06-05

Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

Руководство по применению 2009-01-14

IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Keysight Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Руководство по применению 2008-11-24

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Руководство по применению 2008-11-21

Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

Руководство по применению 2008-10-21

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Руководство по применению 2008-10-15

First pass Yield (FPY) and Alarm Triggers on the Keysight Medalist i3070 In-circuit Test System 
This application note will explain some customizations and how to create alarm triggers.

Руководство по применению 2008-09-26

Setting Up HotKeys for AXI products on the Keysight Medalist Repair Tool 
Users of the Keysight Medalist Repair Tool, also known as the Keysight Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.

Руководство по применению 2008-09-26


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