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器件建模

是德为直流和射频半导体器件表征及建模提供硬件和软件解决方案。当前大多数领先的半导体制造商和集成器件制造商(IDMs)都采用是德工具来获得器件建模方案,以便用于芯片 CMOS、Bipolar、混合砷化镓(GaAs)、氮化镓(GaN)和许多其它器件技术。

器件建模挑战

  • 随着器件几何尺寸越来越小,使用精确模型并控制器件处理性能中的统计变量这种需求显得越来越重要。
  • 电路设计人员需要在直流以及射频和微波频率范围内可以精确预测器件行为的模型。
  • 不同的处理技术需要大量的可以迅速适应独特程序的模型。
  • 建模测量通常耗时数个小时甚至数天,测量控制软件也必须与探测器和仪器协同工作,以便在不同温度条件下执行自动测量。

查看相关视频(优酷) 

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Join Keysight Technologies at DesignCon 2018 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展览会

 
DesignCon 2018 Demo Details 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展览会

 
DesignCon 2018 Show Details 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展览会

 
DesignCon 2018 - Keysight Education Forum 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

展览会

 
国际微波研讨会 (2017) 
June 4 - 9, 2017; Honolulu, Hawaii

展览会

 
是德科技 EEsof EDA 客户培训和服务 
是德科技 EDA 客户培训和服务简介。

培训资料 2017-08-08

 
Test at Breakneck Speeds with System Power Supplies Webcast 
Original broadcast March 30, 2017

网上直播 -- 已存档的

 
Fundamentals of IV Measurements Webcast 
Original broadcast February 8, 2017

网上直播 -- 已存档的

 
Using WaferPro Express with B2200A Switch Matrix 
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

研讨会演示 2016-12-21

PDF PDF 2.35 MB
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

网上直播

 
Multiport and Multi-site Test Optimization Techniques Webcast 
Original broadcast June 3, 2015

网上直播 -- 已存档的

 
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

网上直播 -- 已存档的

 
2011 年国际微波会议(IEEE MTT-S)—是德将在 Agilent Avenue 架起业界专家与领先公司之间的桥梁  
2011 show, last June, 2011; Baltimore Convention Center

展览会

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

网上直播 -- 已存档的

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

网上直播 -- 已存档的

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

网上直播 -- 已存档的

 
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

研讨会演示 2013-10-22

 
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

研讨会演示 2013-10-22

PDF PDF 1.48 MB
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

研讨会演示 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

研讨会演示 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

课堂培训