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Keysightの測定システムは、KeysightのIC-CAP(Integrated Circuit Characterization and Analysis Program)ソフトウェアを使って、設定、制御、自動化を容易に実行できます。KeysightのIP-CAPは、業界最高のデバイス・モデリング測定/パラメータ抽出ソフトウェアであり、精密なDC、CV、Sパラメータ評価に基づいて、詳細なノンリニア・モデル・パラメータ・セットを抽出するために使用できます。IC-CAPでは、簡単に測定をセットアップし、回路シミュレーションと最適化を実行できます。また、Spectre、HSPICE、Eldo、KeysightのAdvanced Design System(ADS)などの 一般的なシミュレータのリストから回路シミュレータを選択できます。


推奨のIC-CAPデバイス・モデリング構成では、DC、CV、ノイズ、RFデバイス測定を実行できます。これらの構成には、半導体デバイスの正確な評価に必要なバイアス回路、ケーブル、アダプタが付属します。IC-CAPデバイス・モデリング構成は、Cascade Microtech社やSuss社などの主要なオンウェーハ測定用プローブ・ステーションと組み合わせて使用できます。

RF評価のためのSパラメータ測定には、KeysightのPNAネットワーク・アナライザが使用されます。DCおよびCV測定には、KeysightのB1500、4156またはE5720半導体パラメータ・アナライザが使用されます。Keysight 11612T/V-Kxx高周波バイアス回路は、測定システムと被試験デバイスとの間の容易なリモート接続を実現し、測定確度が向上します。詳細については、 デバイス・モデリング用推奨モデリング構成を参照してください。


測定ハードウェアの統合、インストール、スタートアップの支援を追加サービスとして提供いたします。Keysight EEsof EDA窓口までお問い合わせください。


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Keysight EEsof EDAユーザ向けメールマガジン -- しみゅレター 

ニュースレター 2017-12-21

IMECAS uses MBP to Create a PDSOI PN Junction Model 
Researchers from the Institute of Microelectronics of Chinese Academy of Sciences (IMECAS) have proposed a new simulation model for the PN junction based on SOI.

事例紹介 2017-11-01

Hangzhou Dianzi University Uses IC-CAP to Extract a Novel, Small-Signal Model for Bulk FinFETs 
Case study on how Hangzhou Dianzi University created a novel compact model for bulk FinFETs that accommodates self-heating behaviors.

事例紹介 2017-10-10

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

データシート 2017-10-04

Customizing Tables Just Got Easier with a New Python Module for MQA Software 
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

記事 2017-07-12

Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

アプリケーション・ノート 2017-07-05

How to Simplify Device Model Extraction using an Open Source User Interface 
This video shows an example of an IC-CAP custom user interface (UI) for device modeling. In the selected modeling application, the DC modeling of a Zener diode is intentionally kept simple in order to demonstrate the features of the UI.

使用法の説明ビデオ 2017-06-26

Static Random Access Memory (SRAM) Cell Modeling in MBP 2017 
This video introduces a new turnkey solution for SRAM modeling now available in Keysight’s Model Builder Program 2017. The video describes the concept of SRAM cell modeling and highlights the major challenges of that process.

デモ 2017-06-12

Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control 
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

記事 2017-05-31

How to Extract a BSIM4 DC Model 
This video introduces a general DC modeling and characterization flow for the BSIM4 model, which is one of the most popular models used by the industry today for bulk CMOS.

使用法の説明ビデオ 2017-05-24

SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

記事 2017-05-04

Python Programming integration with IC-CAP 
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

記事 2017-03-16

Global Device Modeling Services - Brochure 
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

ブローシャ 2017-03-16

WaferPro Expressソフトウェア 

ブローシャ 2017-02-22

Why Device Modeling Services? 
IC design stands on the shoulders of device modeling and characterization.

記事 2017-02-03

Transconductance Modeling for Low-Power Design 
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

雑誌記事 2017-01-18

Device Modeling 101 - What are Ft and Fmax? 
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

雑誌記事 2016-12-18

Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs 
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

雑誌記事 2016-11-17

The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

デモ 2016-10-11

Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

デモ 2016-09-30

Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

製品紹介ビデオ 2016-08-29

Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies 
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

プレス資料 2016-08-04

Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

デモ 2016-07-20

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

プレス資料 2016-07-19

Introducing the 2016 Advanced Low-Frequency Noise Analyzer 
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

デモ 2016-07-18


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