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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 

Keysight RF and Digital Learning Center - A commitment to learning with industry experts 
 

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USB3.1 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of USB 3.1 cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-06

PDF PDF 3.42 MB
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

PDF PDF 10.42 MB
86100D-9FP PAM-N Analysis Software for 86100D DCA-X Oscilloscopes - Data Sheet 
The 86100D-9FP PAM-N analysis software for 86100D DCA-X Series oscilloscopes helps you quickly and accurately analyze electrical and optical Pulse Amplitude Modulated (PAM) signals.

Data Sheet 2015-01-23

PDF PDF 3.16 MB
HDMI and DisplayPort Design and Test – A Better Way - Brochure 
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
Keysight Technologies Exhibits High-Speed Digital Design and Test Solutions at DesignCon 
Keysight announces that it will exhibit its high-speed digital solutions at DesignCon 2015, Booth 725, Santa Clara Convention Center, Jan. 28-29.

Press Materials 2015-01-12

 
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products 
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack

Brochure 2014-12-30

PDF PDF 1.16 MB
Keysight Donates $120 Mil. Gift of Software, Support and Training to Georgia Institute of Technology 
Keysight announces the largest in-kind software donation in its longstanding relationship with the Georgia Institute of Technology.

Press Materials 2014-12-10

 
Keysight Receives Global Frost & Sullivan Award for Market Leadership in Instrumentation Software 
Keysight Technologies announces that Frost & Sullivan has recognized Keysight with the 2014 Global Frost & Sullivan Award for Market Leadership in Instrumentation Software for excellence in capturing the highest market revenue within its industry. The award is based on Frost & Sullivan's recent analysis of the instrumentation software market.

Press Materials 2014-12-08

 
Discovering ADS 
A collection of Keysight EEsof EDA ADS video demonstrations and tutorials

Demo 2014-10-28

 
Keysight to Demonstrate Hardware and Electronic Design Automation Software Solutions at EPEPS 2014 
Keysight Technologies announces it will demonstrate its latest hardware and electronic design automation software solution releases at EPEPS 2014, Embassy Suites Portland, Portland, Oregon, Oct. 26-29. Keysight is a silver-level sponsor of the event.

Press Materials 2014-10-23

 
Method of Implementation (MOI) for HEAC Cable Assembly Test 
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2014-10-20

PDF PDF 1.93 MB
Design Challenges in DDR4 - The Keysight DDR Bus Simulator 
This video is about design challenges in DDR4 and in particular the DDR Bus Simulator, which is a new Keysight EEsof EDA simulation tool for DDR4 and beyond.

Demo 2014-10-16

 
Keysight Technologies Demonstrates Simulation, Debug, Validation and Test Solutions at MemCon 
Keysight announces it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15.

Press Materials 2014-10-13

 
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests 
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-10-10

PDF PDF 1.07 MB
MIPI™ Phy S-Param & Impedance Conformance Test - Test Solution Overview Using the ENA Option TDR 

Technical Overview 2014-10-10

PDF PDF 3.58 MB
HDMI Cable Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of High-Definition Multimedia Interface (HDMI) Cable Assembly Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-10-10

PDF PDF 3.59 MB
DDR Memory Test Solutions Overview 
This video provides an overview of Keysight's DDR Memory test solutions, from simulation, transmitter compliance, protocol, and probing solutions.

Demo 2014-10-03

 
DDR Compliance Integration with Advanced Design System 
The W2351EP DDR4 Compliance Test Bench helps solve the problem of simulation-measurement correlation.

Demo 2014-10-03

 
Keysight Introduces DDR Bus Simulator to Solve the Bit-Error-Rate Contour Simulation Challenge 
Keysight Technologies introduces the DDR Bus Simulator; the industry’s first tool to generate accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification.

Press Materials 2014-09-30

 
High Speed Digital Design and Simulation Videos on YouTube 
Keysight EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.

Demo 2014-08-06

 
Mechanism of Jitter Amplification in Clock Channels 
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-08-04

PDF PDF 715 KB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links 
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-08-04

PDF PDF 1.88 MB
Quick Start for Signal Integrity Design Using Advanced Design System (ADS) – Technical Overview 
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

Technical Overview 2014-08-04

Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-08-04

PDF PDF 1.18 MB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement 
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-08-04

PDF PDF 2.84 MB

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