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N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

產品型錄 2017-10-04

PDF PDF 3.63 MB
x1149 Pin Constraints Feature - Technical Overview 
This overview describes how the pin constraints feature can improve boundary scan test coverage and perform debugging, eliminating manual BSDL file editing and test regeneration.

技術總覽 2017-08-14

PDF PDF 1.10 MB
E5080A Network Analyzer & E5092A Configurable Multiport Test Set - Data Sheet 
This literature describes the technical specifications for E5080A and E5092A.

產品型錄 2017-07-28

PDF PDF 5.23 MB
BT2152A Self-Discharge Analyzer - Data Sheet 
The BT2152A provides revolutionary reduction in the time required to discern good vs. bad cell self-discharge performance in manufacturing.

產品型錄 2017-07-18

W1908 Automotive Radar Library 
The W1908EP/ET SystemVue Automotive Radar Library provides dozens of highly-parameterized simulation models and reference designs for automotive radar scenario simulation.

產品型錄 2017-07-10

BT2191A Self-Discharge Measurement System - Data Sheet 
The BT2191A Li-Ion cell self-discharge measurement system characterizes self-discharge current much faster, with a powerful software for control, graphing, logging and storage.

產品型錄 2017-06-19

i3070 Series 5i Inline In-Circuit Test System – Data Sheet 
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

產品型錄 2017-06-15

i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

產品型錄 2017-03-22

PDF PDF 728 KB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

技術總覽 2017-03-10

PDF PDF 634 KB
Infoline Web Services Suite - Data Sheet  
Achieve your software and hardware management goals with our online and professional services options

產品型錄 2016-09-16

x1149 Boundary Scan Analyzer - Data Sheet 
The Keysight x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

產品型錄 2016-04-07

Mini In-Circuit Tester - Data Sheet 
Keysight Mini In-Circuit Tester is a modular in-circuit test unit fitting a typical 19-inch rack to flexibly complement existing tests in your manufacturing line to increase defects test coverage.

產品型錄 2016-03-07

Challenges and Solutions for Power Electronics Testing Applications - Technical Overview 
This technical overview introduces Keysight solutions for power electronics applications.

技術總覽 2015-09-03

E8782A Pin Matrix and E8783A Pin Matrix Card 
This data sheet provides an overview of and specifications for the Keysight E8782A pin matrix with instrumentation and E8783A pin matrix card.

產品型錄 2015-06-04

PDF PDF 164 KB
車用電子應用功率測試挑戰與解決方案 - 技術總覽 
本文首先概述汽車電子系統的特性,接著說明相關產業所面臨的挑戰,以及汽車電子工程師所需使用的工具。文章最後將介紹是德科技相對應的解決方案,以克服前述的挑戰。

技術總覽 2015-03-12

i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術總覽 2015-02-12

PDF PDF 645 KB
M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

技術總覽 2015-02-10

PDF PDF 2.39 MB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

技術總覽 2015-01-10

i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

技術總覽 2014-11-11

PDF PDF 213 KB
U8903B 高效能音頻分析儀 - 產品規格書 
此產品規格書介紹了 U8903B 高效能音頻分析儀的主要功能、規格以及訂購資訊。

產品型錄 2014-09-05

fA/pA 微電流錶和靜電錶 / 高阻計 - 產品規格書 
全球獨有的圖形式靜電流錶 / 靜電錶,可量測低至 0.01 fA 的電流和高達 10 PΩ 的電阻。

產品型錄 2014-09-01

IC-CAP Device Modeling Software - Technical Overview 
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

技術總覽 2014-08-02

Overview on Noise in Ring Topology Mixers 
This Paper explores the formal definition of noise figure and shows the ADS noise figure definition, and also shows that the noise figure for a mixer does not have to exceed its conversion loss.

技術總覽 2014-07-31

PDF PDF 217 KB
Overview on Phase Noise and Jitter 
This Paper by Rick Poore (Keysight Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.

技術總覽 2014-07-31

PDF PDF 1.29 MB
E5063A ENA 系列 PCB 分析儀 - 技術概論 
E5063A ENA 系列 PCB 分析儀

技術總覽 2014-05-05

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