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Application Information About Specific Components & Devices

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-12-01

 
Validating Automotive Ethernet Conformance and Performance - Case Study 
This case study explores how the BMW Group was successful in validating their automotive Ethernet toolchain, getting visibility into the performance and robustness of the switches integrated in ECUs.

Case Study 2017-11-03

PDF PDF 536 KB
IMECAS uses MBP to Create a PDSOI PN Junction Model 
Researchers from the Institute of Microelectronics of Chinese Academy of Sciences (IMECAS) have proposed a new simulation model for the PN junction based on SOI.

Case Study 2017-11-01

PDF PDF 391 KB
Hangzhou Dianzi University Uses IC-CAP to Extract a Novel, Small-Signal Model for Bulk FinFETs 
Case study on how Hangzhou Dianzi University created a novel compact model for bulk FinFETs that accommodates self-heating behaviors.

Case Study 2017-10-10

PDF PDF 1.12 MB
University Uses ADS to Create an Impedance Matching Method for Wireless Battery Charging  
Learn how NCKU created an impedance matching method for wireless battery charging using Keysight ADS.

Case Study 2017-10-07

PDF PDF 683 KB
Customizing Tables Just Got Easier with a New Python Module for MQA Software 
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

Article 2017-07-12

 
STMicroelectronics & ESEO Use ADS To Design a 2.45 GHz Wireless Power Scavenging Circuit 
Learn how STMicroelectronics and ESEO designed a 2.45 GHz wireless scavenging circuit using Advanced Design System (ADS).

Case Study 2017-06-07

PDF PDF 539 KB
Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control 
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

Article 2017-05-31

 
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

PDF PDF 624 KB
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

 
STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study 
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

Case Study 2017-03-17

PDF PDF 509 KB
Python Programming integration with IC-CAP 
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

 
Why Device Modeling Services? 
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

 
Transconductance Modeling for Low-Power Design 
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Journal 2017-01-18

 
Device Modeling 101 - What are Ft and Fmax? 
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Journal 2016-12-18

 
Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules 
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

Article 2016-11-29

PDF PDF 3.90 MB
Direct-Synthesis Software Approach Facilitates Filter Design 
This Microwaves & RF article discusses how Genesys software can be used to design filters with the direct-synthesis technique. A lowpass filter example is presented to illustrate the software’s capabilities.

Article 2016-11-28

 
Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs 
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

Journal 2016-11-17

 
Software plus signal generators and analyzers support IEEE 802.11p design and test 
Jungik Suh, marketing program manager, Automotive & Energy Solutions, Keysight Technologies, provides input on several Keysight solutions for the connected-car arena for Evaluation Engineering's October print special report on automotive test.

Article 2016-10-05

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2016-07-14

 
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint 
Early implementation of BST can cut test costs and time.

Article 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint 
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

Article 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint 
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

Article 2016-02-16

PDF PDF 409 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint 
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

Article 2016-02-12

PDF PDF 178 KB
Tester for Hire - Article Reprint 
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

Article 2016-02-09

PDF PDF 381 KB

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