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Keysight Technologies, the world’s premier measurement company, offers a full range of design, test, and management solutions that span the range of cellular technologies—from legacy 1G systems through 3G systems such as HSPA to 3GPP Long Term Evolution (LTE) and 1xEV-DO. Keysight products cover the lifecycle from early design and development, through volume manufacturing, to network deployment and service assurance. So as you take cellular forward, Keysight clears the way.

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태양 전지를 위한 온도 측정 솔루션과 모듈 테스트 - 어플리케이션 노트(영어)  
이 어플리케이션은 히어러블(Hearable) 테스트 솔루션에 대해 설명합니다. 이 어플리케이션 노트는 히어러블(Hearable) 테스트를 책임 지고 있는 R&D 엔지니어, 테스트 엔지니어 또는 테스트 랩(lab) 직원에게 도움이 될 수 있습니다.

어플리케이션 노트 2017-12-02

8 Hints for Better Scope Probings - Application Note 
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

어플리케이션 노트 2017-11-23

Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials 
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

어플리케이션 노트 2017-11-21

PDF PDF 2.10 MB
Six Reasons Your New IoT Device Will Fail - Application Note 
You’ve carefully tested your new IoT wireless device. What did you forget that could cause your device to work perfectly in the lab but fail in the real world?

어플리케이션 노트 2017-11-13

PDF PDF 1.06 MB
How to Select the Right Current Probe - Application Note 
Oscilloscope current probes enable oscilloscopes to measure current, extending their use beyond just measuring voltage. Basically, current probes sense the current flowing through a conductor and convert it to a voltage that can be viewed and measured on an oscilloscope. There are many different types of current probes you can choose from and each probe has an area where it performs best. This application note will introduce you to the common types of current probe solutions, the fundamental principles, the advantages and limitations between each current probe type, and the practical consideration for using current probes for oscilloscope applications to make the most out of them.

어플리케이션 노트 2017-11-09

PDF PDF 1.41 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note 
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

어플리케이션 노트 2017-11-08

PDF PDF 8.01 MB
Oscilloscope in Medical Imaging Applications - Measuring Power Integrity and Current Measurement 
This application brief explores how Keysight oscilloscopes help designers validate the medical instrument’s IO interface for data processing in image reconstruction.

어플리케이션 노트 2017-11-06

PDF PDF 553 KB
How to Test USB Power Delivery (PD) Over Type-C - Application Note 
USB Type-C power delivery creates possibilities for USB connected devices with higher, bi-directional power and power for non-USB devices with ALT mode. Learn more about verification/compliance.

어플리케이션 노트 2017-11-01

Automated Configuration of Scan Path Linkers Using x1149 - Application Note 
The automated scan path linker configuration feature introduced with the release of software version 1.6.0.0 simplifies scan path linker configuration for five scan path linker devices commonly used in the industry.

어플리케이션 노트 2017-10-10

PDF PDF 2.64 MB
Testing 5G: Data Throughput - Application Note 
This application note describes the new challenges of testing high data rates and provides a solution to these challenges using Keysight’s Protocol R&D Toolset.

어플리케이션 노트 2017-09-30

PDF PDF 2.76 MB
Precision Jitter Transmitter - DesignCon 2005 
Precision Jitter Transmitter whitepaper

어플리케이션 노트 2017-09-28

PDF PDF 1.10 MB
Effect of Indenter Tip Heating in High-Temperature Nanoindentation Measurements - Application Note 
Independently heating and monitoring the temperature of both indenter tip and sample helps determine high-temperature mechanical properties of materials using static/dynamic measurement methods.

어플리케이션 노트 2017-09-27

PDF PDF 1.11 MB
Evaluate Lithium Ion Self-Discharge of Cells in a Fraction of the Time Traditionally Required 
This new way to determine a cell’s self-discharge by measuring its self-discharge current allows cells with excessively high self-discharge to be identified and isolated much quicker vs traditional open-circuit voltage approaches.

어플리케이션 노트 2017-09-18

PDF PDF 1.67 MB
Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

어플리케이션 노트 2017-09-07

Coherent Optical Communications Test Challenges - Application Note 
This Application Note focuses on the test and troubleshooting of next-generation fiber-based communication systems tasked with supporting 100 Gb/s, 400 Gb/s data rates and higher.

어플리케이션 노트 2017-08-31

PDF PDF 1.70 MB
Brittle-to-Ductile Plasticity Transition Behavior Study of Si by High-Temperature Nanoindentation 
Nanomechanical response of single crystal silicon at various temperatures were studied using elevated temperature nanoindentation with Keysight G200 laser heater system.

어플리케이션 노트 2017-08-21

PDF PDF 657 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note 
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

어플리케이션 노트 2017-08-21

PDF PDF 5.16 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note 
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

어플리케이션 노트 2017-08-21

PDF PDF 598 KB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note 
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

어플리케이션 노트 2017-08-18

PDF PDF 4.22 MB
Narrowband IoT (NB-IoT): Cellular Technology for the Hyperconnected IoT - Application Note 
This paper explains the underlying reasons why this technology is shaped as it is today and explore the challenges in adopting this new application and explains the new ways of securely roll out NB-IoT application quickly to market.

어플리케이션 노트 2017-08-08

High-Temperature Nanoindentation on Pure Titanium (Ti) - Application Note 
High-temperature mechanical properties of Pure Titanium was successfully tested by G200 Nano Indenter Laser Heater over a range of temperature from ambient to 500°C.

어플리케이션 노트 2017-07-31

PDF PDF 524 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

어플리케이션 노트 2017-07-31

PDF PDF 1.38 MB
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

어플리케이션 노트 2017-07-05

PDF PDF 2.47 MB
Optical Signal Measurements Using A Real-Time Oscilloscope - Application Note 
If your application includes a repetitive waveform that requires lower noise, jitter and a higher dynamic range, a sampling oscilloscope is a good choice.

어플리케이션 노트 2017-06-27

PDF PDF 907 KB
Medalist i3070 Test Throughput Optimization - Application Note 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

어플리케이션 노트 2017-06-16

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