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聯絡是德專家

元件建模與特性分析

是德提供完整的硬體和軟體解決方案,可用於半導體元件特性分析與建模。 現在大多數半導體大廠和整合式元件製造商 (IDM) 都採用是德工具來建構元件建模解決方案,以便針對晶片 CMOS、Bipolar、混合砷化鎵 (GaAs)、氮化鎵 (GaN) 和許多其他元件技術進行測試。 準確的元件特性分析、精確先進的模型、有效的擷取及詳盡的驗證,是建立準確及強大模型庫的關鍵,也是設計成功的重要因素。

元件建模與特性分析挑戰

  • 隨著元件尺寸越來越小,使用準確的模型並控制元件處理效能之統計變數,已變得越來越重要。
  • 電路設計工程師需要能夠直流以及射頻和微波頻率範圍內,準確預測元件行為的模型。
  • 不同的處理技術需要可因應不同處理程序,迅速進行調適的各種模型。
  • 建模量測通常耗時數小時甚至幾天的時間,量測控制軟體也必須與探測器和儀器協同運作,以便在不同溫度條件下執行自動量測。

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2018-01-04

 
IMECAS uses MBP to Create a PDSOI PN Junction Model 
Researchers from the Institute of Microelectronics of Chinese Academy of Sciences (IMECAS) have proposed a new simulation model for the PN junction based on SOI.

案例研究 2017-11-01

PDF PDF 391 KB
Hangzhou Dianzi University Uses IC-CAP to Extract a Novel, Small-Signal Model for Bulk FinFETs 
Case study on how Hangzhou Dianzi University created a novel compact model for bulk FinFETs that accommodates self-heating behaviors.

案例研究 2017-10-10

PDF PDF 1.12 MB
N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

產品型錄 2017-10-04

PDF PDF 3.63 MB
Customizing Tables Just Got Easier with a New Python Module for MQA Software 
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

專文 2017-07-12

 
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

應用手冊 2017-07-05

PDF PDF 2.47 MB
How to Simplify Device Model Extraction using an Open Source User Interface 
This video shows an example of an IC-CAP custom user interface (UI) for device modeling. In the selected modeling application, the DC modeling of a Zener diode is intentionally kept simple in order to demonstrate the features of the UI.

使用說明影片 2017-06-26

 
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017 
This video introduces a new turnkey solution for SRAM modeling now available in Keysight’s Model Builder Program 2017. The video describes the concept of SRAM cell modeling and highlights the major challenges of that process.

基本展示 2017-06-12

 
Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control 
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

專文 2017-05-31

 
How to Extract a BSIM4 DC Model 
This video introduces a general DC modeling and characterization flow for the BSIM4 model, which is one of the most popular models used by the industry today for bulk CMOS.

使用說明影片 2017-05-24

 
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

專文 2017-05-04

 
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2017-04-25

PDF PDF 3.12 MB
Global Device Modeling Services - Brochure 
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

型錄 2017-03-16

PDF PDF 1.59 MB
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

型錄 2017-02-22

PDF PDF 2.75 MB
為何需要元件建模服務? 
元件建模和特性分析是成功 IC 設計的基礎。

專文 2017-02-03

 
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

型錄 2017-01-24

PDF PDF 2.54 MB
Transconductance Modeling for Low-Power Design 
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

期刊 2017-01-18

 
Device Modeling 101 - What are Ft and Fmax? 
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

期刊 2016-12-18

 
Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs 
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

期刊 2016-11-17

 
The High-Frequency, High Speed Design Revolution: Why Your Design & Test Flow Will Soon Be Obsolete 
In this keynote from EDI CON USA 2016, Todd Cutler, vice president and general manager of Keysight Design & Test Software, discusses these trends and explains how, when coupled with market pressures, they are driving a revolution in the design and measurement industry.

基本展示 2016-10-11

 
Unlocking Millimeter Wave Insights 
It is easy to underestimate the challenges at millimeter-wave frequencies, and this amplifies the importance of integrated tools for design, simulation, measurement, and analysis. Learn more about how Keysight is taking the mystique out of millimeter waves and unlocking new insights.

基本展示 2016-09-30

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

產品導覽 2016-08-29

 
Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies 
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

新聞資料 2016-08-04

 
Low Frequency Noise Analyzer Technical Demo 
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

基本展示 2016-07-20

 
Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform 
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

新聞資料 2016-07-19

 

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