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Design and Simulation of High-Speed Digital

Keysight Signal Integrity (SI) and Power Integrity (PI) tools leverage the time and frequency domains to quickly solve the underlying problems with high speed digital designs. The integrated schematic capture, layout, and data analysis environment with multiple simulators including IBIS-AMI channel, transient, s-parameter, and physical layer EM ensure compliant designs with the latest standards. In support of the channel simulations with in the Advanced Design System (ADS) environment, designers can use EMPro software for full 3D-EM simulation of complex channel component models, and SystemVue software to generate custom IBIS-AMI Tx and Rx behavioral models for fast channel simulation. With Keysight, you’ll achieve your best design.

High Speed Digital Design Challenges

  • Analyzing complete chip-to-chip links by co-simulating individual components, each at its most appropriate level of abstraction: channel-, circuit- or physical-level
  • Importing channel component S-parameter models accurately into circuit and channel simulations, avoiding causality and passivity issues
  • Correlating measured and simulated data to verify design methods and reduce design spins with virtual prototyping

Introduction to SIPro Video

Click the image above to view a demonstration of the workflow in ADS for SI and PI applications.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts 

Explore YouTube Videos 

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W2307EP Interconnect Toolbox Element 
ADS offers signal integrity simulation tools to help explore design trade-offs and manage the complex interactions between substrate stack-up, transmission line losses, and via topology.

Brochure 2018-06-05

How to Design for Power Integrity: Optimizing Decoupling Capacitors 
This short video will show how to optimize the decoupling capacitors for your next power delivery network.

How-To Video 2018-06-01

Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2018-03-05

Using De-embedding Tools for Virtual Probing - Application Note 
Discusses using de-embedding tools to gain virtual access to difficult measurement points

Application Note 2018-02-23

Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-12-01

DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2017-12-01

ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2017-10-31

N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

Data Sheet 2017-10-04

End-to-End System-Level Simulations with Repeaters for PCIe® Gen4: A How-To Guide 
DesignCon 2017 - The paper describes how to quickly and effectively evaluate the end-to-end link performance of a PCI-Express Gen-4 link involving a Root Complex, a Repeater, and an End Point.

Application Note 2017-08-28

Technical Experts Discuss, Demonstrate Latest EM Compatibility Techniques, SI Solutions at EMC 2017 
Keysight's electromagnetic (EM) and signal (SI) and power integrity (PI) experts will be available at the 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (EMC 2017) to discuss a range of topics.

Press Materials 2017-08-02

Time & Frequency Domain Simulation-to-Measurement Techniques by Mike Resso 
This presentation discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Demo 2017-06-18

Sierra Circuits Interviews Heidi Barnes at DesignCon 
During DesignCon 2017, Sierra Circuits interviewed Heidi Barnes, Senior Applications Engineer at Keysight Technologies and recipient of the DesignCon Engineer of the Year Award.

Demo 2017-06-07

S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

Article 2017-05-30

Power Integrity Ecosystem by Heidi Barnes from Keysight  
This Power Integrity overview provides an understanding of power integrity, why it is important, how to design for it, and it teaches techniques for high-fidelity simulation, analysis and measurement.

Demo 2017-05-29

The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

Article 2017-05-24

Keysight Technologies to Present a Vision for 5G Evolution at WAMICON 2017  
Keysight experts will be at WAMICON 2017, an annual IEEE Wireless and Microwave Conference, to discuss everything from circuit-level modeling to system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications, and aerospace & defense.

Press Materials 2017-04-10

How to Design for Power Integrity: DC-DC Converter Modeling and Simulation 
This video describes how to create an accurate DC-DC Converter measurement based model (MBM) from just a few simple measurements.

How-To Video 2017-04-07

W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library  
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

Data Sheet 2017-03-21

Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Journal 2017-03-04

Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Article 2017-02-23

Signal and Power Integrity Products & Options Summary  
Signal and Power Integrity Products & Options Summary

Selection Guide 2017-02-22

Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year 
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

Press Materials 2017-02-02

IBIS-AMI Modeling and Simulation of Link Systems using Duobinary Signaling 
DesignCon 2017 - In this paper, an extension to the IBIS AMI standard to include duobinary signal modeling and simulation is proposed.

Application Note 2017-01-31

IBIS-AMI Modeling of Asynchronous High Speed Link Systems 
DesignCon 2017 - This paper proposes a modified IBIS-AMI model simulation flow for asynchronous link systems.

Application Note 2017-01-31


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