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Digital Design and Test Webcast Series 
Live and on-demand broadcasts that will teach you new measurement techniques that will help you get your product to market faster

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Nepcon China 2018 
Asia : Apr. 24-26, 2018 (Booth 1C57) Shanghai World Expo Exhibition & Convention Center-NEPCON China 2018 South Entrance: No 1099 Guozhan Rd Shanghai China North Entrance: No 850 Bocheng Rd. Shanghai China

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International Microwave Symposium (IMS) 2018 
June 10 - 15, 2018; Philadelphia, Pennsylvania

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DesignCon 2018 Show Details 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

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Join Keysight Technologies at DesignCon 2018 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

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DesignCon 2018 Demo Details 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

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DesignCon 2018 - Keysight Education Forum 
January 31 - February 1, 2018; Santa Clara Convention Center, CA

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Advancements in Non-Destructive Testing of Composite Materials Webcast 
Original broadcast April 26, 2017

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Printed Circuit Board (PCB) Test and Inspection - Archived Event and Seminar Material 

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Assembled PCB Inspection: SJ Family - Archived Event and Seminar Material 

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Medalist i5000 - Archived Event and Seminar Material 

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In-circuit Test - Archived Event and Seminar Material 

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Medalist 3070 - Archived Event and Seminar Material 

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Removing the Human Touch – It’s Time ICT Goes Fully Automated Webcast Series 
2015 webcast series

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MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

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Multiport and Multi-site Test Optimization Techniques Webcast 
Original broadcast June 3, 2015

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RF/uW Switching Solutions Webcast 
Original broadcast July 8, 2015

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Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

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PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

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Boundary Scan Webcast Series 
Live and on-demand webcasts

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Best practices in implementing boundary scan on limited access boards 
Original broadcast December 18, 2014

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Non-destructive testing of powders, ceramic, oils, & other composite materials 
Original broadcast December 11, 2014

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Testing limited access SSD boards with boundary scan and external instruments webcast 
Original broadcast December 4, 2014

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Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

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Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

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