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ATE Applications

Your test system architecture should give you choices. Its range of possibilities should fit your requirements, preferences and existing test assets —instrumentation, software and I/O — now and in the future. With approaches to match your test needs, Keysight ATE is designed to maximize your system's longevity and productivity.

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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Notes d’application 2018-12-01

Solar Array Simulator System - Technical Overview 
The Keysight Solar Array System provides precise, fast and cost efficient simulation of multiple segment solar array output characteristics.

Présentation technique 2018-06-13

PDF PDF 2.41 MB
i3070 Series 5i Inline In-Circuit Test System – Data Sheet 
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

Fiche signalétique 2018-06-12

Aerospace and Defense Systems Team - Brochure 
Keysight’s Aerospace and Defense Systems Team is a specialized group of measurement experts and consultants that apply comprehensive analysis and problem-solving techniques to complex measurement challenges that cannot be addressed with off-the-shelf solutions or legacy measurement techniques.

Brochure 2018-06-06

PDF PDF 1.85 MB
Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer - Application Note 
This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

Notes d’application 2018-05-25

PDF PDF 2.07 MB
EPM and EPM-P Series Power Meters E-Series Power Sensors - Configuration Guide 
This configuration guide describes the standard configurations, options, and compatible accessories of EPM Series and EPM-P Series power meters.

Guide de configuration 2018-04-17

Phase Noise Measurement Solutions - Selection Guide 
This selection guide will discuss and compare Keysight's most common phase noise measurement techniques -- direct spectrum, phase detector, two-channel cross correlation, including selection tips.

Guide de sélection 2018-01-26

PDF PDF 5.20 MB
Understanding Phase Noise Needs and Choices in Signal Generation - Application Note 
Learn about phase noise signal generator fundamentals and ways to optimize phase noise for your application.

Notes d’application 2018-01-12

Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Notes d’application 2017-12-05

Payload Test System - Technical Overview 
Keysight's Payload Test System Platform uses state of the art measurement capability to provide a base configuration for Uplink and Downlink testing between UHF and Q band.

Présentation technique 2017-12-01

PDF PDF 1.70 MB
Using MATLAB to Create Keysight Signal and Spectrum Analyzer Applications - Application Note 
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

Notes d’application 2017-12-01

PDF PDF 9.69 MB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Présentation technique 2017-12-01

PDF PDF 550 KB
Noise Figure Selection Guide - Minimizing the Uncertainties - Selection Guide 
This selection guide, which includes a brief noise figure primer and our current product lineup, is designed to help you find the best solution for your application.

Guide de sélection 2017-12-01

x1149 Pin Constraints Feature - Technical Overview 
This overview describes how the pin constraints feature can improve boundary scan test coverage and perform debugging, eliminating manual BSDL file editing and test regeneration.

Présentation technique 2017-08-14

PDF PDF 1.10 MB
M9393A PXIe Performance Vector Signal Analyzer up to 50 GHz - Data Sheet  
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Fiche signalétique 2017-04-29

Calibration Refresh Assemblies - Solution Brochure 
Keysight's Z2090B-335 Series CalPod Assemblies offer a unique connectivity and calibration refresh between your PNA and device under test at any time without disconnecting.

Brochure 2017-03-29

PDF PDF 1.50 MB
Z2090B-033 Power and Data Bus Test System Technical Overview 
This system provides command and telemetry signals, BER testing, DC power I/F, data storage and standard signal interfaces including RS422/485 and IEEE 1553 for satellite panel and unit test.

Fiche signalétique 2016-08-31

PDF PDF 1.17 MB
M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Guide de configuration 2016-05-18

PDF PDF 2.26 MB
M9393A PXIe Performance Vector Signal Analyzer - Flyer 
This document provides the features, benefits and performance characteristics for the M9393A PXIe performance vector signal analyzer.

Brochure 2015-10-22

PDF PDF 500 KB
Extending the Life of Test Systems that Support Long-term Programs - Application Note 
As an original equipment manager (OEM), we offers efficient and effective alternatives that can extend the life of systems and ensure that the individual instruments are meeting their warranted spec.

Notes d’application 2015-06-12

Keysight Extends Duration of Instrument Service, Warranties for New and Out-of-Production Models 
Unmatched Range of Service Offerings is Focused on Customers’ Long-term Success

Dossier de presse 2015-06-01

PDF PDF 25 Bytes
New Reference Solution Speeds Monitoring, Validation of Satellite Signals - Press Release 
The new Reference Solution enables the engineer to monitor large blocks of spectrum and perform precise digital modulation analysis validate satellite signal integrity.

Dossier de presse 2015-02-11

 
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

PDF PDF 10.42 MB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

Présentation technique 2015-01-10

New Software Enables Capture, Analyzing Threats and Jamming Responses - Press Release  
The new 89600 VSA software's pulse analysis option (BHQ) is used in radar and electronic counter measure applications for capturing and analyzing threats and jamming responses.

Dossier de presse 2015-01-07

 

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