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ta-acquisition-and-metersegmentation:business-unit/EISG,segmentation:campaign/Bench,keysight:product-lines/gm,segmentation:product-category/DMMs_DAQs_Function_Generators/Data_Acquisition_Systems,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-metersegmentation:business-unit/EISG,segmentation:campaign/Bench,keysight:product-lines/gm,segmentation:product-category/DMMs_DAQs_Function_Generators/Data_Acquisition_Systems,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-metersegmentation:business-unit/EISG,segmentation:campaign/Bench,keysight:product-lines/gm,segmentation:product-category/DMMs_DAQs_Function_Generators/Data_Acquisition_Systems,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-metersegmentation:business-unit/EISG,segmentation:campaign/Bench,keysight:product-lines/gm,segmentation:product-category/DMMs_DAQs_Function_Generators/Data_Acquisition_Systems,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:funnel/bofu,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/industry/wireline-communications,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition,keysight:dtx/solutions/facets/design-and-test-product/data-acquisition-and-meter
멀티채널 전류 측정 방법
전류 누설 여부를 확인하고 여러 회로 지점에서 모니터링하려면 멀티채널 전류 측정 시스템이 필요합니다. 어떻게 제품 설계 단계에서 DAQ 시스템을 사용해 멀티채널 전류 측정을 수행할 수 있는지 알아보십시오.
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