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Fast, Efficient Wafer Level Test

We will present a fast and efficient optical and electro-optical wafer and die level testing solution with both surface and edge coupling. Keysight’s integrated photonic test solution integrates with FormFactors’ CM300xi probe station through PathWave Test Automation plugins. Additional Keysight products included are KS8400A TAP and plugins, N7700C Photonic Application Suite, N4372E Lightwave component analyzer (LCA), 81606C tunable laser source (TLS), N7745C multiport power meter, N7786C polarization synthesizer, and the new M9601A PXIe source measure unit.

Solution Capabilities:

  • 110 GHz O/E and E/O test
  • Complete optical and RF test
  • Fully integrated and automated

Brochure

Integrated Photonics Test

White Paper

Integrated Photonics Revolutionize Data Center Interconnects

Product

Integrated Photonics

Application Note

On-Wafer Testing of Opto-Electronic Components

Wafer and Chip-Level Optical Test Application Note

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