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N5413B and N5413C DDR2 and LPDDR2 Compliance Test Application

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Test, Debug, and Characterize your DDR2 and LPDDR2 Designs Quickly and Easily

The Keysight Technologies, Inc. DDR2 and LPDDR2 compliance test application provides a fast and easy way to test, debug, and characterize your DDR2 and LPDDR2 designs. The tests performed by the DDR2 compliance test software are based on the JEDEC 1 JESD79-2E DDR2 SDRAM Specification, JESD208 Speciality DDR2-1066 SDRAM Specification, and Intel DDR2 667/800 JEDEC Specification Addendum Rev. 1.1. The tests performed by the LPDDR2 compliance test software are based on the JEDEC JESD209- 2 LPDDR2 Specification. In addition, both the DDR2 and LPDDR2 test application features Custom mode, which covers crucial measurements such as eye-diagram, mask testing, ringing, and other tests that are not covered in the specifications but are critical for characterizing DDR2 and LPDDR2 devices. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis.

DDR2 represents an evolutionary upgrade to DDR for memory systems. DDR2 promises higher bandwidth, smaller chip footprints, less power consumption, and less heat generation. DDR2 achieves this with a number of innovations including the use of modern fine ball-grid array (FBGA) packaging, lower supply power, and on-die termination for improved control of signal integrity.

LPDDR2 also presents similar technology improvement as DDR2 with significant reduced power by scaling down the voltage of DDR2 from 1.8 to 1.2 V.

Signal integrity is crucial for memory system interoperability. Reference clock jitter measurements help you ensure that jitter is well within the specifications, which is the key to reliable and interoperable modular memory systems. At the same time, electrical and timing characteristics of signals are critical as well, to ensure the memory system functions correctly and stays error free.

The addition of the DDR2 and LPDDR2 debug tool helps memory designers perform pre- and post-compliance testing with saved oscilloscope waveform traces. The tool allows for navigation capability with measurement markers to help navigate to problem areas for further testing.

The DDR2 and LPDDR2 compliance test application is compatible with Keysight 9000 and 90000 Series Infiniium oscilloscopes.


The N5413B DDR2 and LPDDR2 compliance test application offers several features to simplify the validation of your DDR2 and LPDDR2 designs:

  • Setup wizard for quick setup, configuration, and test
  • Execution speed and proven test algorithm for clock test, which minimizes your compliance test time
  • User-selected tests and configurations based on JEDEC JESD79-2E and JESD208 DDR2 SDRAM with an option to turn on JESD209-2 LPDDR2 data rate and user-defined speed for embedded designs
  • Unique technique to provide read/write burst signal separation on the same bus in real-time mode, allowing powerful debug and analysis
  • Ability to analyze the loading effect of adjacent RANK of the same memory channel
  • Test framework provides powerful characterization through multiple trials that show a full array of statistics for each measurement and returns the worst measurement value
  • Automatically perform derating table calculations for setup and hold time measurements based on slew rate
  • DDR debug tool allows for navigation to areas of interest in a saved set of waveforms with JEDEC measurement for pre- and post-compliance testing

Comprehensive Test Coverage

With the DDR2 and LPDDR2 compliance test application, you can use the same oscilloscope you use for everyday debugging to perform automated testing and margin analysis based on the JEDEC electrical and timing specifications. The application automatically configures the oscilloscope for each test and provides informative results. It includes margin analysis, indicating how close your device comes to passing or failing the test for each specification.

Some of the difficulties in performing the compliance tests are connecting to the target device, configuring the oscilloscope, performing the tests, and analyzing the measured results. The DDR2 and LPDDR2 compliance test application does most of this work for you. If you discover a problem with your device, the Custom mode feature in the test application and debug tools in the oscilloscope are available to aid in root-cause analysis.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing DDR2 and LPDDR2 devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests, and view the test results. On the environmental setup page, you can select the type of DDR2 or LPDDR2 devices, and the framework automatically filters the tests based on your selection. You can then select a category of tests or specify individual tests. The user interface is designed to minimize unnecessary reconnections, which saves time and minimizes potential operator error. You can save the tests and configurations as project files and recall them later for quick testing and review of previous results. Clear menus let you perform tests with minimum mouse clicks.

DDR debug tool is a license tool that enables JEDEC measurement on saved waveform traces with navigation capability and markers to identify problem areas for debug and margin testing.

Configurability and Guided Connection

The DDR2 and LPDDR2 compliance test application provides flexibility in your test setup. The DDR2 and LPDDR2 compliance test application provides you with user-defined controls for critical test parameters such as voltage threshold values, number of waveforms used for analysis, and customizable violation settings. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected.

With the multiple test trial capability, you can extensively characterize the performance of your DDR2 devices. You can run the selected tests until the stop condition is met. The application will then save the worst-case conditions and help you track down the anomalies in your signals.

In addition to providing you with measurement results, the DDR2 and LPDDR2 compliance test application reports how close you are to the specified limit. You can specify the level at which warnings are to be issued. You are provided with a full array of statistics for each measurement, and you can save worst-case conditions to extensively test the performance of your device.


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