Introducing MBP 2013.01

MBP 2013.01 introduces a number of new features and major enhancements to the MBP Platform. As the industry’s leading silicon model extraction platform, MBP 2013.01 continues supporting the newly released CMC standard models and their latest versions.

Integrated Modeling Data Flow

Keysight offers end-to-end turn-key silicon device modeling flow from measurement, model extraction to model validation. MBP 2013.01 supports IC-CAP/WaferPro IV, CV, and S-parameter data files (MDM files) natively for all kinds of device types without explicit data conversion. In addition, MBP 2013.01 also enables users to query measurement data stored in IC-CAP/WaferPro SQL/SQLite databases and load them directly for model extraction.

Figure 1. Integrated Modeling Data Flow.

Modeling SOP Enablement

A new feature in MBP 2013.01, called “Model Reviewer”, makes it possible to standardize various aspects of device modeling in a team environment, such as model extraction policies, extraction environment setup, data usage, parameter range enforcement, and review procedure. It not only enables improved model quality and overall efficiency inside a modeling team, but also helps the modeling team improve customer communication and shorten project turn-around time.

Circuit-based Model Extraction

To meet the increasing demands on circuit-based model extraction, in MBP 2013.01, the internal engine adds the support of transient analysis on benchmark circuits such as ring oscillators. Users can select, tune and optimize the model parameters of the NMOS and PMOS model cards to fit the figure of merits (FOMs) of a circuit (e.g. stage delay, dynamic power, and leakage power of ring oscillators).

Figure 2. The relationship of circuit FOMs (leakage power and delay time) with the supplied voltage in a ring oscillator.

GUI-based Custom Model Extraction Environment

In MBP 2013.01, the new GUI-based custom model extraction environment enables users to customize their own extraction flow using the graphical user interface (GUI) and on the fly. Users can adjust the extraction steps dynamically in the interactive GUI without coding or compiling. It provides users a more flexible, automated modeling environment where greater attention to intermediate extraction results and more engineering judgment calls are often required, such as for cutting-edge technologies.

Built-in Principal Component Analysis (PCA)

Principal Component Analysis is widely used in variation modeling. MBP 2013.01 integrates PCA capabilities internally. It enables the complete PCA-based variation model automated extraction flow inside MBP with NMOS and PMOS correlation support. The stage-by-stage flow implementation enables users the flexibility to fine tune each step of the extraction flow. Together with the support of backward propagation of variance (BPV)-based modeling methodology since 2010, MBP provides the industry’s most complete and widely adopted variation modeling solution.

Figure 3. N/P correlation plot.

MBP 2013.01 Licensing

If you are upgrading from MBP 2012.07, you can continue to use your existing license file as long as it is still valid. If you are upgrading from any earlier version before MBP 2012.07, you must apply for a new license file in order to use MBP 2013.01 properly.

Solaris Discontinuance

As previously announced, the Solaris (SUN OS) platform support has been discontinued and MBP 2013.01 is only supported on the LINUX Red Hat and Windows® operating systems.

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