The 4155C offers all inclusive instrument solutions and easy operation for various parametric tests. Both can be used with bundled notebook PC or as stand alone instruments.
Modular SMU Series (E5270B, E5260A, E5262A and E5263A)
A flexible family of products, with solutions for both precise parametric measurement of semiconductor devices and high speed testing of components (E5260A, E5262A, E5263A and E5270B).
41501B Pulse Generator and Expander Unit for the 4155C/4156C [단종]
The Keysight 41501B SMU and Pulse Generator Expander unit is available to augment the measurement capabilities of the 4155C and 4156C. It is user-configurable and offers additional SMUs and PGUs.
Low-leakage switch mainframe solutions, positioned between the semiconductor parameter analyzer and the wafer, reduce cost of test through characterization test automation (B2200A, B2201A and E5250A).