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Parametric Test Solutions
Time-to-Market and Lower Cost-of-Test
- Reduce your cost-of-test by high throughput
- Overcome your test challenges in R&D and production
- Precise low-level measurement performance
- Proven solution in many customers in the world
- Global support formation with skillful engineers
- Various solution line-up with low transition cost
Migrate to the platform that solves your toughest test challenges
Compare Series/Products
| Series / Products | Maximum Number of Measurement Pins | Minimum Current Measurement Resolution | Minimum Voltage Measurement Resolution | Maximum Number of SPGU output channels |
|---|---|---|---|---|
| 4082A Parametric Test System | 48 | 1 fA | 2 micro volt | n/a |
| 4082F Flash Memory Cell Parametric Test System | 48 | 1 fA | 2 micro volt | 10 channels |
| 88000 HS-100 High Speed and Sensitivity TFT Array Test System | 2304 | 5 pA | 2 millivolt | n/a |
|
NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution
NEW! |
2 | 1 pA | n/a | n/a |
|
P9001A Massively Parallel Parametric Test System
NEW! |
100 | 1 fA | 2 micro volt | n/a |
Software
* Prices for: United States. Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.
