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Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.

Key Benefits of Device Modeling Products

  • Integrated Circuit Characterization and Analysis Program (IC-CAP) is a versatile and user programmable industry standard for semiconductor device modeling
  • Model Builder Program (MBP) is a complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA) is the industry standard SPICE model signoff and acceptance software
  • WaferPro Express supports wafer-level measurement and programming test software for use with a variety of instruments and wafer probes.
  • Advanced Low-Frequency Noise Analyzer (A-LFNA) supports on-wafer measurement and analysis of flicker noise and random telegraph noise
     

Learn about Device Modeling and Characterization

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IC-CAP 2020 Update 1.0 Release Notes
IC-CAP 2020 Update 1.0 Product Release Notes.

릴리스 노트 2019-09-13

RF GaN Device Models and Extraction Techniques
This presentation was recorded at IMS 2019. The Workshop covers the market trends, technology and challenges in using Gallium Nitride (GaN) devices.

기본 데모 2019-08-30

IIT Kanpur Develops ASM-HEMT Model for GaN Transistors Using Parametric and Device Characterization
The India Institute of Technology Kanpur creates an accurate and simple compact SPICE model and introduces an industry-grade model for power electronics and RF applications.

사례연구 2019-07-10

PDF PDF 1.90 MB
PathWave Design Software
Accelerate your design cycle with integrated design and simulation software. Know your performance under simulated real-world conditions before you build.

브로셔 2019-07-01

PDF PDF 13.23 MB
Transforming Engineering Education with Cutting-Edge Keysight Labs
Keysight is committed to continue with innovation that will enable researchers, educators, and students.

사례연구 2019-06-25

PDF PDF 2.03 MB
Keysight Technologies Accelerates Design Workflows with New PathWave Design 2020 Software Suite
Keysight announces PathWave Design 2020, which includes the latest releases of Keysight's electronic design automation software to accelerate design workflows for radio frequency (RF) and microwave, 5G, and automotive design engineers.

보도자료 2019-06-03

신설 회사를 위한 키사이트테크놀로지스 EDA 소프트웨어 "스타트업 프로그램"
신설 회사를 위한 키사이트 EDA 소프트웨어 "스타트업 프로그램"은 프로모션입니다.

판촉 자료 2019-05-22

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

뉴스레터 2019-04-09

Improved Data Sharing Across Product Development Workflow Would Improve Time to Market
Keysight Survey Reveals Improved Data Sharing Across the Entire Product Development Workflow Would Improve Time to Market for Electronic Devices.

보도자료 2019-04-08

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

브로셔 2019-02-28

PDF PDF 2.89 MB
The Future of Design and Simulation Workflows
While design engineers are facing many challenges, the most pressing are in the areas of data sharing and analysis. This report underscores the need for a new way to connect design and test data across the workflow.

어플리케이션 노트 2019-02-22

MBP 2019 설명서
MBP(Model Builder Program) 2019 제품 설명서

참조 가이드 2019-02-07

MBP 2019 릴리즈 노트
MBP(Model Builder Program) 2019 제품 릴리즈 노트

릴리스 노트 2019-02-07

MQA 2019 Release Notes
Model Quality Assurance (MQA) 2019 product release notes.

릴리스 노트 2019-02-07

MQA 2019 Documentation
Model Quality Assurance (MQA) 2019 Product Documentation.

참조 가이드 2019-02-07

IC-CAP Device Modeling Software
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software. The IC-CAP platform enables the measurement, characterization and modeling model parameter extraction of both discrete and on-wafer devices.

기술 개요 2018-12-03

MBP(Model Builder Program)
MBP는 실리콘 디바이스 모델링을 위한 자동화 및 유연성을 모두 제공하는 원스톱 솔루션입니다.

브로셔 2018-11-28

PDF PDF 1.71 MB
Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

브로셔 2018-11-26

PDF PDF 3.46 MB
E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

데이터시트 2018-09-28

Set up a measurement project with WaferPro Express – WMS Series Part 6 of 6
In this video, we will set up a new project in WaferPro Express, defining our measurements on our desired devices.

기본 데모 2018-05-09

Configure WaferPro Express for measurements and probing – WMS Series Part 3 of 6
In this video, we will show you how to connect WaferPro Express to the instruments and then to the Velox prober control software.

기본 데모 2018-05-09

Align wafer probes and create a wafer map – WMS Series Part 4 of 6
In this video, we demonstrate how to align a wafer to the reference plane of our probing system using the auto align feature in Velox. We will then generate a wafer map.

기본 데모 2018-05-09

Perform on-wafer RF calibration – WMS Series Part 5 of 6
In this video, we demonstrate an on wafer network analyzer calibration to 50 GHz.

기본 데모 2018-05-09

Automated on-wafer millimeter wave measurements demo – WMS Series Part 2 of 6
In this demo, we measure S-parameters on a GaAs MESFET and capacitor structure in an automated fashion across the wafer. This leverages a lot of pieces together that will be explained in later videos: • configuring the WaferPro Express software to drive other instruments and wafer prober software • wafer alignment • RF S-parameter calibration • WaferPro Express project set up

기본 데모 2018-05-09

Introduction to Wafer-level Measurement Solutions (WMS) – WMS Series Part 1 of 6
In this video we present an overview of the hardware and software used for making wafer level measurements up to 110 GHz.This is part of a 6 part video series on wafer level measurements.

기본 데모 2018-05-09

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