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PCBA용 i3070 시리즈 6 회로내 테스트 시스템

입증된 기술을 토대로 개발된 키사이트의 i3070 시리즈 6 회로내 테스트(ICT) 시스템은 오랜 기간 성능을 입증해온 소프트웨어와 하드웨어 및 프로그래밍 성능으로 테스트 효율을 높여줍니다. i3070 시리즈 6 ICT 테스터는 IoT와 5G, 자동차 및 에너지를 포함한 다양한 분야의 폭넓은 인쇄 회로 보드 어셈블리(PCBA) 크기를 지원합니다. i3070은 측정 회로와 테스트 대상 디바이스 간 가장 짧은 신호 경로를 제공하는 독자적인 설계 방식을 채택하고 있어, 기생 커패시턴스로 인한 원치 않는 영향을 최소화하고, 크로스톡에 대한 면역성을 개선하고, 표유 신호 커플링 효과를 제거하므로 일관되고 반복 가능한 측정을 제공합니다. 시리즈 6은 이전 시스템과 완벽하게 역 호환이 가능하며 반복도가 뛰어난 측정이 가능합니다.

i3070 시리즈는 6 ICT의 주요 이점은 다음과 같습니다.

  • 40% 이상 더 빠른 실리콘 네일/바운더리 스캔 테스트와 대부분의 PCBA에서 6% 더 빠른 전반적인 테스트로 테스트 효율성 개선
  • 100% 역 호환성으로 설치 및 전체 코드 호환을 위한 가동 중단 최소화
  • IPC-CFX(IPC Connected Factory Exchange) 및 IPC-HERMES-9852 표준과 같은 인증된 M2M(machine-to-machine) 기능으로 운영 효율성 제고, 테스트 데이터 통찰력 개선, 반응 시간 단축, 운영비 절감
  • 최신 소프트웨어 라이센싱으로 라이센스 비용에 대한 이해도 개선, 라이센스의 중앙 집중식 관리, 생산량에 따른 확대/축소

새로운 i3070 시리즈 6 회로내 테스트 플랫폼은 이동형 테스트 기능을 제공하며 최첨단 4차 산업혁명 기술을 더해 키사이트의 주요 인쇄 회로 어셈블리 제조 고객들에게 높은 수율, 빠른 처리량, 동급 최고의 운영 효율성 등 다양한 이점을 제공합니다.

디지털 기능을 갖춘 경제적인 회로내 테스트 시스템에 대해서는 키사이트의 최신 i1000D 시스템을 참조하십시오.

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혁신적인 테스트 자산 보호

키사이트 교육 프로그램을 통한 변화 역량 개발

교육 과정을 살펴보고 비즈니스 요구에 맞는 커리큘럼 로드맵을 확인해 보십시오.

H7230A-510 i3070 Boundary Scan Concepts and Applications

Learn the advanced topics for developing Boundary-Scan Test applications on the i3070 in-circuit board tester. This class covers various concepts in boundary-scan testing, such as serial programming and testing non-boundary-scan devices using boundary-scan. In addition to testing development, various debugging techniques are also detailed. The class concludes with a "best practices" section.

H7230A-516 i3070 Advanced Digital

Learn the advanced topics for developing Digital Test applications on the i3070 in-circuit board tester. This class builds upon the fundamentals of digital vector control language (VCL) and pattern capture format (PCF) that were presented in the Fundamentals classes. The attendee will learn about erase, program, and verification techniques for parallel memory, serial memory, and devices.

H7230A #500 i3070 Family Multiplexed User Fundamentals Class I

Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

H7230A #555 i3070 Family Multiplexed User Fundamentals Class II

Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

H7230A #514 i3070 UnMuxed User Fundamentals I

In this course, test developers will learn the standard tools that are readily available on the i3070.

H7230A #515 i3070 UnMuxed User Fundamentals II

In this course, test developers learn to customize tests, generate custom test models and receive an introduction to many of the optional test tools available on the i3070.

H7230A #520 i3070 Family Production Support Training

Learn to support the 3070 on the production line - turn-on and debug tests developed by other programmers, run testhead diagnostics and interpret the results, isolate faults (testhead, fixture, test program, printed circuit board...)

H7230A #550 3070 Family Maintenance Fundamentals

Gain an understanding of the Keysight 3070 service documentation, Confirmation, and Diagnostics, System-level card operation, power, analog, digital, and control subsystem operation, and troubleshooting.

H7230A #530 i3070 In-Line Production Support Training

New production line Technicians and Engineers supporting i3070 In-Line testers on the factory floor. The participant is trained on operational requirements and best practices to set up, run, and maintain automated i3070 In-Line testers. The participant is also instructed on the basics of i3070 hardware, software to maintain production and support implementation of product ECO.

특집 리소스: i3070 회로내 테스트 시스템

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2023.01.05

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.05

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2022.04.25

Fixture Reusability Consideration From In-line to Offline

Fixture Reusability Consideration From In-line to Offline

This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.

2022.04.25

Case Studies 2022.11.10

10% Increase in ADAS PCBA Testing Throughput

10% Increase in ADAS PCBA Testing Throughput

Automotive electronics manufacturers must be prepared to address new test challenges efficiently and effectively as advanced driver assistance systems (ADAS) technology advances. This case study shows how an automotive electronics manufacturer used the Keysight in-line 4 module ICT and PathWave Manufacturing Analytics Software to cut down on labor-intensive tasks and increase test throughput.

2022.11.10

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

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