Single Connection Passive Intermodulation and S-parameter Measurements

Single Connection PIM and S-parameter measurements

Keysight Technologies and ACEWAVETECH

Fast, accurate, single connection PIM and S-Parameter testing of passive components

Passive Intermodulation (PIM) distortion occurs in components such as antennas, cables, connectors or filters with two or more high-power input signals. The occurrence of PIM can result in a significant decrease in the quality of a wireless communication system.

S-parameters such as return loss or insertion loss are essential measurements for passive components, and both PIM and S-parameters must be tested to fully qualify a passive device. Conventional test systems require a network analyzer and separate PIM analyzers in order to test a device. When different test stations are used the time required to connect and disconnect the components can be significant and greater than the actual testing time.

A new solution from ACEWAVETECH (AWT) allows the measurement of PIM and S-parameters with a single connection. The AWT solution uses the Keysight E5072A ENA series network analyzer to perform S-parameter measurements combined with AWT multiband PIM analyzers. The system can be used to test wideband passive components in R&D, production or Quality Assurance.

PIM analyzers are typically designed for a specific frequency band. To test a device in multiband operation, multiple analyzers are required. Up to four PIM analyzers can be configured in the AWT system. When using multiple instruments for PIM measurements, all the measurement instruments are controlled by the system and measurements are synchronized for each data point. This is important for swept-frequency PIM measurements where many data points are required.

• Single connection measurement of PIM and S-parameters
• Uses Keysight E5072A ENA series network analyzers
• Flexible configuration, fast and accurate measurements
• Up to 4 PIM analyzers in a single configuration for multi-band test
• Measures return loss, insertion loss and PIM
• Used in R&D, production and QA
• Verifies complete performance of passive components
• Cost-effective solution for mass production

Single Connection PIM and S-parameter measurements

The AWT system is a compact, high performance and cost-effective solution providing fast and accurate measurements. With AWT’s integrated solution, both PIM and S-parameter measurements can be performed without changing the physical connections of the DUT.

This reduces the time spent connecting and disconnecting a DUT and improves significantly your overall test throughput