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価格: 日本

* 参考価格、標準納期は予告無く変更されることがあります。詳しくはお問い合わせ下さい。 価格は希望小売価格です

主な特長と仕様

  • Compliance testing of clock jitter, electrical and timing measurements in accordance to JEDEC specifications
  • Comprehensive analysis that automates the complex measurements, even when you are not there
  • JEDEC test measurement with navigation capability for DDR Debug
  • Statistical analysis on read and write data for margin testing
  • Data analytics capabilities which include data import into data repository server and aggregate test results viewing

概要

Use the DDR4 and LPDDR4 application to test, debug and characterize your DDR4 and LPDDR4 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report at the end of the test. The application not only compare the results with the specification test limit but also includes margin analysis which indicates how closely the device passes or fails each test. In addition, the complex analysis of the DDR4 and LPDDR4 signals is taken cared by the application which saves user time and effort if the measurements are done manually.

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