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Active Hot Parameters (Option 110)

購入窓口
  • Keysight - 納期はお問合せ下さい

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価格: 日本

* 参考価格、標準納期は予告無く変更されることがあります。詳しくはお問い合わせ下さい。 価格は希望小売価格です

主な特長と仕様

  • Removes active device and system interaction and precisely calculate the active parameters and output power into a 50 ohm environment
  • Removes system-to-system correlation problems
  • Use X-parameter technology.
  • Provide various traces for detail analysis:

              o Hot S11/12/21/22, hot gain, hot match

              o Input/output power

              o Coefficient (output, direct reflection, image reflection)

              o Gamma-optimum, etc.

概要

Active hot parameters (Option 110) for PNA-X Series provides a more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing the X-parameter technology. It removes the active device and system interaction to precisely calculate the active parameters and output power into a nominal 50 ohm environment. The advanced theory removes system-to-system correlation problems. It also provides coefficients of equation to calculate linear and non-linear device performance of gamma-opt (optimum), optimal load match and maximum delivered power to optimum load. A total of 14 traces (parameters) are available with various sweep types, such as frequency sweep, power sweep, or two-dimensional frequency and power sweep. Requires PNA-X models 4-port configuration (N524xA Option 400, Option 400/419, or Option 400/419/423) and Option 080 frequency-offset measurement.