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N9545F SECM (Scanning Electrochemical Microscopy)

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主な特長と仕様

  • Performs highly localized electrochemistry via a nanoelectrode combined with an AFM probe
  • Allows scanning electrochemical microscopy (SECM) on conductive and insulating samples
  • Convenient, preconfigured EC SmartCart probes reduce setup time
  • Built-in potentiostat and full-featured software greatly enhance experimental flexibility
  • Customized SECM nosecone designed exclusively for Keysight atomic force microscopes
  • Integrates SECM and AFM technologies to deliver superior performance and ease of use

概要

The AFM combined with SECM mode is a seamlessly integrated technology package that enables scientists to perform scanning electrochemical microscopy (SECM) on conductive and insulating samples with a state-of-the-art atomic force microscope from Keysight Technologies. This new Keysight mode of AFM operation has been designed to provide ultimate performance as well as supreme ease of use.

At the technological core of Keysight’s new SECM mode is the novel EC SmartCart, an easy-to-handle cartridge that combines a nanoelectrode with a pre-mounted AFM tip. EC SmartCart probes come pre-tested and ready-to-scan for AFM-SECM applications including the investigation of homogeneous and heterogeneous electron transfer reactions, the imaging of biologically active processes, surface modification, analysis of thin films, screening of catalytic material, and corrosion process studies.