検索された製品ページを表示しています その他の検索結果:

 

お問い合わせ窓口

Discontinued Atomic Force Microscopes and Scanning Electron Microscopes

1-25 / 144

並べ替え
AFM-Based Characterization of Electric Properties of Soft Materials - Application Note
Local electric and dielectric properties of materials in a broad frequency range (up to several GHz) and effects of vapor condensation have been studied with environmental AFM in this note.

アプリケーション・ノート 2018-03-09

PDF PDF 3.12 MB
Studying Thermal Transitions of Materials Using Quick Scan Technology in Atomic Force Microscopy

アプリケーション・ノート 2017-12-22

PDF PDF 5.03 MB
【電池素材評価】高周波を用いたインピーダンス分布測定による電極の均一性/劣化観察
AFM + VNAによる新しい電極の観測手法

ブローシャ 2017-12-04

PDF PDF 549 KB
Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

アプリケーション・ノート 2017-11-21

PDF PDF 2.10 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

アプリケーション・ノート 2017-11-08

PDF PDF 8.01 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the digital controller with the 5500 AFM

データシート 2017-10-26

PDF PDF 546 KB
9500 AFM - Data Sheet
Data sheet for the 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

データシート 2017-10-26

PDF PDF 2.69 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

アプリケーション・ノート 2017-08-21

PDF PDF 598 KB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

アプリケーション・ノート 2017-08-18

PDF PDF 4.22 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

アプリケーション・ノート 2017-06-15

PDF PDF 3.96 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

アプリケーション・ノート 2017-04-18

PDF PDF 1.80 MB
5600LS High Resolution Large Stage AFM - Data Sheet

データシート 2017-03-20

PDF PDF 4.85 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

アプリケーション・ノート 2017-03-09

PDF PDF 5.29 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

アプリケーション・ノート 2017-03-09

PDF PDF 4.15 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

アプリケーション・ノート 2017-03-09

PDF PDF 6.24 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

アプリケーション・ノート 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

アプリケーション・ノート 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

アプリケーション・ノート 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

アプリケーション・ノート 2016-10-11

PDF PDF 1.13 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

ブローシャ 2016-09-22

PDF PDF 4.63 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

アプリケーション・ノート 2016-08-30

PDF PDF 2.89 MB
電気物性/電気化学解析 ナノスケール素材の形状測定/特性評価ソリューション
液中/雰囲気中の形状、電界/磁界分布などを視覚化!

ブローシャ 2016-08-01

PDF PDF 532 KB
表面形状観測 半導体ウエハー/ダイ、レジスト、ポリマー等の表面観測ソリューション

ブローシャ 2016-07-28

PDF PDF 414 KB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

アプリケーション・ノート 2016-07-15

PDF PDF 3.31 MB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

アプリケーション・ノート 2016-07-13

PDF PDF 1.64 MB

1 2 3 4 5 6 次へ