Studying Thermal Transitions of Materials Using Quick Scan Technology

Application Notes

Atomic Force Microscopy (AFM) studies conducted at different temperatures, have been widely used to monitor structural changes and thermal transitions of various materials and their related mechanical and electrical property variations. Because experiments in variable temperature often require surface imaging from hundreds of nanometers to nearly a hundred microns, these studies benefit from scanning rates up to 50 Hz for fast and accurate recording of morphological transformations and nanoscale structures in milliseconds.

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Studying Thermal Transitions of Materials Using Quick Scan Technology

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