High speed spot, MOSFET Id measurement, Example1
Spot, MOSFET Id measurement, Example2
Pulsed spot, MOSFET Id measurement, Example3
Staircase sweep, MOSFET Id-Vd measurement, Example4-1, Example4-2
Staircase sweep, MOSFET Id-Vg measurement, Example5
Pulsed sweep, bipolar Tr Ic-Vc measurement, Example6
Sweep with p-bias, bipolar Tr Ic-Vc measurement, Example7
Quasi-pulsed spot, bipolar Tr BVceo measurement, Example8
Linear search, MOSFET Vth, Example9
Binary search, MOSFET Vth, Example10
Multi-ch sweep, bipolar Tr Ic/Ib-Vb measurement, Example11
Program memory, MOSFET Id spot + display, Example12
Program memory, MOSFET Id spot + display + var, Example13
Trigger 1, MOSFET Id measurement, Example14
Trigger 2, 2-terminal device IV measurement, Example15
Binary data, MOSFET Id measurement, Example16