IOT8700 Series IoT Wireless Test Solutions for Single and Multiple DUTs

Build Confidence in IoT – 4x Faster

Your customers need confidence in their high-value or mission-critical IoT devices. This requires balancing test time and coverage. For WLAN (up to IEEE 802.11ac) and Bluetooth® Low Energy (BLE) devices, Keysight’s IOT8700 Series is a complete wireless test solution: hardware, software, and RF shielded enclosure. These solutions simplify over-the-air (OTA) signaling test of complete devices running their final commercial firmware. This reduces the test time per DUT because there is no need to write and rewrite device memory before and after testing or to use a chipset-specific driver for device control.

The IOT8700 Series lets you accelerate OTA testing with true parallel measurements of up to four BLE devices with one tester. This cost-effective solution includes essential measurement functionality, signaling test, and enhanced capabilities such as deep radio control and UUID read/write. These timesaving solutions help you keep up with project schedules, and the unique combination of size, speed, and functionality helps you reduce the overall cost of test. The IOT8700 Series gives validation engineers fast insights into device performance, and the BLE and WLAN signaling test makes the IOT8700 Series an excellent companion device for in-house or independent compliance test labs.

Purpose-built for IoT device testing, the IOT8700 Series makes it easy to perform conducted and nonconducted tests to validate DUT performance with measurements of crucial test parameters: receiver packet error rate (PER), advertising interval, and channel-based transmitter/receiver (Tx/Rx) power.

Streamline test development and increase productivity

Whether you need to perform manual testing of single DUTs or semi-automated testing of multiple units, the IOT8700 Series enables maximizes throughput in your production environment and reduces time-tomarket. You can test up to four BLE devices in parallel with one station or stack multiple units for greater space savings. Both the single- and multi-DUT solutions address a broad range of applications with enhanced capabilities such as deep radio control and universal unique identifier (UUID) read/write. This makes it easy to control DUT Tx/Rx in operating modes such as modulation, frequency, and channel settings, and to use UUID read/write to easily retrieve and overwrite BLE device properties.

To simplify and accelerate test development, the IOT8700 Series uses Keysight’s PathWave-based automation software. The efficient and modern graphical user interface (GUI) enhances testing and posttest analysis. PathWave also includes functionality that enables you to automate test-plan creation and easily reconfigure test sequences without using command-level programming. 

When test budgets are lean, our wireless test solutions let you leverage low startup costs for RF functional testing. Compact hardware and simple cable connections make it easy to set up new test stations. You can complete each solution with optional RF-shielded enclosures, available in three sizes.

Reduce your overall cost of test

For test managers, the pressure to reduce costs never stops. With the IOT8700 Series, you can reduce per-device test times and improve test throughput with true parallel testing. A single test station can cover BLE, WLAN, or both. These compact units (175 mm × 105 mm × 25 mm) save valuable floor space but delivers quantitative, repeatable, and traceable OTA measurements of your DUT’s performance. This helps you ensure product quality by catching manufacturing defects and reducing field costly field failures.

Get fast insights into device performance

In the development of high-value or mission-critical IoT devices, validation testing helps ensure a smooth transition to manufacturing. With the IOT8700 Series, you can validate the performance of new or enhanced designs under a variety of real-world operating modes. For example, deep radio control makes it easier to measure transmit power and receiver PER. In addition, you can test throughput performance at different data rates, frequency channels, and bandwidth settings.