Keysight provides test solutions for fast and efficient integrated and silicon photonics wafer and chip level test.

Wavelength and polarization dependent optical and electro-optical measurements from 1240–1640 nm:

  • Photonic application suite
  • Tunable lasers
  • Polarization synthesizers
  • Optical power meters and source measure units (standalone and modular)
  • Optical signal conditioning with optical switches and attenuators

High frequency electro-optics measurements up to 110 GHz:

  • Lightwave component analyzers
  • Optical modulation analyzers

Wafer probing with FormFactor Silicon Photonics CM300xi probe station

Test automation:

  • Test recipes, measurement plan definition and execution with KS8400A Keysight test automation platform (TAP)
  • Automated wafer probe station control with N7700210C Wafer prober TAP plug-in
  • Automated E/O and O/E LCA measurement with N4370P01A LCA TAP plug-in


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