Accelerate the development of Next Generation Non-Volatile Memory
Application Notes
For basic IV characterization to CV, pulsed IV measurement and reliability testing for flash and emerging NVM on a single instrument
B1500A semiconductor device parametric analyzer
Key features:
- IV measurement ranges of 0.1 fA to 1 A and 0.5 μV to 200 V
- AC capacitance measurement from 1 kHz to 5 MHz
- Up to ± 40 V voltage pulse and arbitrary waveform generation
- Automatic resource switching between IV measurement and pulse generation
- Pulsed IV/Transient IV capability up to 200MSa/s without load line effect
Benefits:
- Accurately measure the IV and CV curve, supporting automated parameter extraction
- Quickly and easily perform reliability test such as endurance and retention by automatically switching between pulse stress cycle and IV measurement
- Precisely perform advanced measurements such as NBTI/ PBTI, RTN (Random Telegraph Noise) ) using pulsed IV/ transient IV capability