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N5222A PNA Microwave Network Analyzer, 26.5 GHz

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Supporting Documents

Explore how this product addresses specific measurement challenges.

Exploring the Architectures of Network Analyzers (1287-2) – Application Note
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.
Applying Error Correction To Vector Network Analyzer Measurements - Application Note
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.
Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4)
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.
Network Analysis - In-Fixture Measurements (1287-9)
Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10)
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...
Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.
Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1)
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.
Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).
Mixer Transmission Measurements Using The Frequency Converter Application (1408-01)–Application Note
Microwave PNA Series Network Analyzer Application Note, mixer transmission measurements using the frequency converter application note 1408-1
Mixer Conversion-Loss and Group-Delay Meas. Techniques and Comparisons (1408-02) – Application Note
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.
Improving Meas. and Calibration Accuracy using the Frequency Converter (1408-3) – Application Note
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3
PNA - Amplifier Linear and Gain Compression Measurements (1408-7)
Application note covering testing of an amplifier's linear S-parameters and gain compression using Keysight's microwave PNA Series of vector network analyzers.
PNA - Amplifier Swept-Harmonic Measurements (1408-8)
This application note cover testing an amplifiers harmonics, using (MW) PNA Series of vector network analyzers. Linear parameters, such as gain and return loss are covered in Application Note 1408-7.
PNA - Amplifier-CW and Swept IMD Measurements (1408-9)
This application note covers testing an amplifier's intermodulation-distortion products, using (MW) PNA Series of vector network analyzers.
PNA - Amplifier - High-Power Testing (1408-10)
PNA - Pulsed Measurement Accuracy (1408-11)
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
PNA - Analyze Lightwave Components (1408-14)
Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note
Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.
Measuring Group Delay of Frequency Converters with Embedded LO
High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19
This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA).
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
Solutions for Active Device Test
This application note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership.
On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.
Electronic vs. Mechanical Calibration Kits: Calibration methods and Accuracy – White Paper
The purpose of this paper is to clarify the differences between electronic and mechanical calibrations and how these differences affect measurement accuracy.
ENA/PNA Calibration - User Characterization: Electronic Calibration
ECal modules offer calibrations in a fraction of the time it would take to calibrate using mechanical calibrations, and are not just limited to quick accurate calibrations.
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracey.
Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.
Integrated, Turnkey Modeling and Measurement Systems - Article Reprint
This article first appeared in the March 2016 edition of Microwave Journal.
Faster Testing with High-Performance Spectrum Analysis in a VNA - Article Reprint
Article reprint from the June 2015 issue of Microwave Journal highlighting the new spectrum analyzer option for the PNA Series.
The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

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