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N5241A PNA-X Microwave Network Analyzer, 13.5 GHz

  • Discontinued |
  • Currently Supported
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Supporting Documents

Explore how this product addresses specific measurement challenges.

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.
Measuring Group Delay of Frequency Converters with Embedded LO
Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note
Time Domain Analysis With a Network Analyzer Application Note (AN 1287-12)
This document focuses on time domain analysis (displays) generated from vector network analyzers (VNA). The intent is to provide engineers with frequency domain background, an in-depth view of how a time domain display is created from frequency domain data (S-parameters) and how to apply the time domain display to common problems in RF systems.
Evaluating X-parameter Models for Active Device Nonlinear Behavior (AN 1408-22)
This AN examines three different modeling techniques that can be used to capture nonlinear behavior in a PA: the more conventional S2D and P2D, and the more recently commercialize X-parameter model.
Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note
Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracey.
Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.
Application of Keysight's PNA-X NVNA and X-Parameters in Power Amplifier Design
This 16-page article appeared in Microwave Journal's May 2011 issue; teaches you how to obtain actual linear and nonlinear component behavior to improve power amplifier design using Keysight's solutions.
High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19
This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA).
Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.
Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis
This article explores how architectural advances such as a second internal signal generator, a signal combiner, signal-routing switches, and internal pulse modulators and generators can be used to greatly expand the range of measurements achievable with the PNA-X.
X-parameters: Commercial implementations of the latest technology enable mainstream applications
This blog article from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.
Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3
Accurate Spectrum Analysis Up to THz with Your Vector Network Analyzer - White Paper
This white paper will focus on the addition of the new PNA spectrum analyzer capability into the MMW and sub-MMW VNA solution including the technology that made it possible and how it is accomplished.
Integrated, Turnkey Modeling and Measurement Systems - Article Reprint
This article first appeared in the March 2016 edition of Microwave Journal.
Faster Testing with High-Performance Spectrum Analysis in a VNA - Article Reprint
Article reprint from the June 2015 issue of Microwave Journal highlighting the new spectrum analyzer option for the PNA Series.
Microwave Engineering Europe X-parameters Article
The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

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