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P9001A Massively Parallel Parametric Test System NEW!

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Key Features and Functions
  • The highest throughput parallel parametric test solution
  • 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080
  • Good data correlation with Keysight 4080
  • New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency)
  • Easy development of parallel test plan
  • Easy migration from 4080 environment
  • Proven in 1st-tier logic foundries and memory companies

Software for this Product

* Prices for: United States. Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.