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Fast Total Jitter Test Solution

Product Status: Discontinued | Currently Supported
This product is no longer available

No replacement found for this product.

Key Features & Specifications

  • Easy to use, just select BER and resolution
  • Works on any jitter distribution
  • Receive the measured TJ, phase margin and according measurement uncertainty

Description

Fast TJ Measurement for an opt. transceiver

The new Fast Total Jitter Measurement is more than forty times faster than common total jitter measurements. This smart way of measuring total jitter enables R&D engineers in the computer, semiconductor and communications industry to easily perform high-quality Total Jitter measurements, thereby helping to simplify analysis and speed up the development of new products.

The new Fast Total Jitter Measurement is independent on jitter modeling and works on any jitter distribution.

The fast TJ measurement is simple to make requiring the user to only select the desired bit error ratio and the resolution accuracy.

Not only is the TJ result available, but also the uncertainty of the TJ measurement is determined which defines the significance of the result.

The new Fast Total Jitter Measurement is the implementation of the reward winning “Total Jitter Measurement at Low Probability Levels, using Optimized BERT Scan Method” presented at the DesignCon West 2005.

The Fast Total Jitter measurement is included in the new software releases of the ParBERT 81250 System and the N4901B/02B Serial High-Performance BERTs. The software updates are free for download.

  • For the ParBERT 81250 Systems software click here
  • For the N4901B/02B Serial High-Performance BERTs click here
  • For more information on the N4900 series click here
  • For more information on the ParBERT Systems click here

 

  • Forty times faster than BERTScan
  • Easy to use, just select BER and resolution
  • Works on any jitter distribution
  • Receive the measured TJ, phase margin and according measurement uncertainty