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PD1500A Dynamic Power Device Analyzer/Double Pulse Tester

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Key Features & Specifications

  • Reliable, repeatable measurement of wide-bandgap (SiC, GaN) power semiconductor dynamic characteristics
  • Characteristics measured include, turn-on, turn-off, switching, reverse recovery, gate charge, and many others
  • Sate test environment for both the DUT and the user
  • Expandable, upgradeable, modular platform enables testing of all power devices

Description

As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.

The ability to ensure repeatable DPT results is built on Keysight’s expertise in measurement science. Examples include innovations in high-frequency testing (gigahertz range), low leakage (femto-ampere range), and pulsed power (1,500 A current, 10 μs resolution). As a result, Keysight is uniquely positioned to help you overcome the challenges of dynamic power-semiconductor characterization.

Included with the PD1500A are standard measurement techniques such as probe compensation, offset adjustment, de-skewing, and common mode noise rejection. These techniques are utilized within an innovative measurement topology and layout. A semi-automated calibration routine (AutoCal) that corrects for system gain and offset errors was specifically developed for this system. The system also uses de-embedding techniques to compensate for inductive parasitics in the current shunt.