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N109256CA TX Test Automation SW Application for OIF-CEI 4.0

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Prices for: United States

* Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.

Key Features & Specifications

Comprehensive measurement and debug solution

  • Characterizes CEI-56G-VSR/MR/LR TX designs defined by OIF-CEI-04.0
  • Performs over 100 tests
  • Key measurements include jitter, eye linearity, SNDR, eye-opening (EW6, EH6), and return loss

Flexible and extensible

  • Operate on an 86100D DCA-X oscilloscope, or on a PC connected to an N109x DCA-M via USB
  • Automatic HTML report generation
  • Test all or selected parameters to compliance limits or custom limits


  • N1000A DCA-X Mainframe
  • 86100D DCA-X Mainframe
  • N109X DCA-M Oscilloscope
  • N107X Clock Recovery


The Keysight N109256CA TX test application can be used with the N1000A/86100D DCA-X or N109X DCA-M Series oscilloscopes to quickly and accurately perform NRZ and PAM4 measurements according to:

  • CEI-56G-VSR (Reference OIF2014.277.08 NRZ, OIF-CEI-04.0 PAM4)
    • Section 15.3.2 Host to Module at TP1a, Table 15-1 (NRZ)
    • Section 15.3.3 Module to Host at TP4, Table 15-4 (NRZ)
    • Appendix 15.B.1.1 Host-to-Module at TP0a, Table 15.9 (NRZ)
    • Section 16.3.2 Host to Module at TP1a (Host Output), Table 16-1 (PAM4)
    • Section 16.3.3 Module to Host at TP4 (Module Output), Table 16-4 (PAM4)
    • Appendix 16.B.1.1 Host to Module at TP0a, Table 16.10 (PAM4)
  • CEI-56G-MR (Reference OIF-CEI-04.0)
    • Section 17.3.1, Table 17-2 and 17-3 (MR-PAM4)
  • CEI-56G-LR (Reference OIF-CEI-04.0)
    • Section 21.3.1, Tables 21-2, 21-3 (LR-PAM4)

The N109256CA is an easy-to-use TX test application that:

  • Saves time in understanding details of standards
  • Reduces the time it takes to characterize your PAM4 and NRZ design from hours to minutes
  • Helps debug your device using custom configurations
  • Allows you to quickly generate HTML reports that summarize the performance of your device

Key measurements include:

  • Jitter Measurements including UUGJ, BUJ, Even-Odd Jitter (EOJ)
  • Output Waveform measurements including Steady-State Voltage (Vf), Linear Fit Pulse Peak and Signal-to-Noise-and-Distortion (SNDR)
  • Transition Time
  • Eye Width (EW6) and Eye Height (EH), Far-end and Near-end
  • Return Loss

For a comprehensive and up-to-date list of specific tests covered by the application, download and install the N109256CA .exe onto a PC (click the Trials and Licenses tab), and run the application in “Demo Mode”. No license (or hardware) is required to run the software application in “Demo Mode”.