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N6472A IEEE802.3bs/cd Compliance Application for Infiniium Real-Time Oscilloscopes

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Key Features & Specifications

Comprehensive measurement and debug solution

  • Performs PAM4 and NRZ measurements as outlined in the IEEE802.3bs and IEEE802.3cd specifications
  • Makes nearly 300 tests
  • Level-based (noise, linearity), eye-based (EW6, EH6), jitter, and return loss tests

Flexible and extensible

  • Operates on the Keysight Z-Series real-time oscilloscopes
  • Automatic HTML report generation
  • Test all or selected parameters to compliance limits or custom limits

Compatibility

  •  Z-Series real-time oscilloscopes

Description

Demand for increased network bandwidth in data centers continues to grow. Pulse Amplitude Modulation (PAM) is a multi-level signaling format that is enabling technology to help address this need.

The Keysight N6472A IEEE802.3bs/cd Compliance Application for Infiniium Real-Time Oscilloscopes is designed to accurately and quickly characterize PAM4 and NRZ electrical signals and address PAM and NRZ measurement needs as outlined in the IEEE802.3bs and IEEE802.3cd standards.

Performing PAM4 and NRZ measurements as per requirements of developing industry standards can be challenging and difficult. You can save time and maximize the accuracy of your PAM4 measurements by using the Keysight N6472A IEEE802.3bs/cd Compliance Application with your Z-Series real-time oscilloscope. This tool will allow you to measure your Pulse Amplitude Modulation 4-Level (PAM4) and NRZ design according to the measurement requirements detailed in the IEEE802.3bs and IEEE802.3cd standards.

Performs a number IEEE802.3bs and IEEE802.3cd clauses including 400GAUI-x, 200GAUI-x, LUAI-2, 100GAUI-x, 50GAUI-x, 200GBASE-CR4, 100GBASE-CR2, 50GBASE-CR, 200GBASE-KR4, 100GBASE-KR2 and 50GBASE-KR with more than 140 PAM4 and more than 150 NRZ tests including:

  • Jitter measurements to include Uncorrelated Unbounded Gaussian Jitter (UUJ), Bounded Uncorrelated Jitter (BUJ) and Even-Odd Jitter
  • Critical Eye measurements on all eyes including Eye levels, RMS level and Level Separation Mismatch Ratio
  • Output waveform measurements including Linear Fit Pulse Peak and Signal-to-Noise-and-Distortion Ratio (SNDR)
  • Differential and Common-Mode Output Return Loss measurements
     

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