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N8836A PAM-4 Measurement Application for Ethernet and OIF-CEI for Real-Time Oscilloscopes

Product Status: Discontinued | Currently Supported
This product is no longer available

Key Features & Specifications

Comprehensive measurement and debug solution

  • Performs PAM-4 measurements as outlined in drafts documents that cover OIF-CEI 4.0 and IEEE 400G (802.3bs)
  • Makes more than 25 tests
  • Level-based (noise, linearity), eye-based (EW6, EH6), jitter, and return loss tests

Flexible and extensible

  • Operates on the Keysight Z-Series, V-Series, X-Series, S-Series, and 90000A Series real-time oscilloscopes
  • Optional switch matrix support available for multi-lane testing
  • Automatic HTML report generation
  • Test all or selected parameters to compliance limits (proposed in draft specification document) or custom limits


  • S-Series, 90000A, V-Series, 90000 X-, and Z-Series real-time oscilloscopes


Demand for increased network bandwidth in data centers continues to grow. Pulse Amplitude Modulation (PAM) is a multi-level signaling format that is enabling technology to help address this need. The switch from NRZ to PAM-4 is revolutionary, rather than evolutionary from 100G, presenting many new design and measurement challenges.
The Keysight N8836A PAM-4 measurement application for Ethernet and OIF-CEI for Infiniium real-time oscilloscopes is designed to accurately and quickly characterize PAM-4 electrical signals and address future PAM measurement needs as outlined in developing standards.

Performing PAM-4 measurements as per requirements of developing industry standards can be challenging and difficult. You can save time and maximize the accuracy of your PAM-4 measurements by using the Keysight N8836A software application with your S-Series, 90000A, V-Series, 90000 X-, V-Series, or Z-Series real-time oscilloscope. This tool will allow you to measure your Pulse Amplitude Modulation 4-Level (PAM-4) design according to the measurement requirements detailed in the draft, industry standards listed below:

  • OIF-CEI-56G-MR-PAM4 medium reach
  • OIF-CEI-56G-VSR-PAM4 very short reach interface
  • IEEE 400G (802.3bs)

Performs more than 25 tests including:

  • Level-based measurements (using linearity pattern)

    • Level thickness (rms and pk-pk)
    • Level noise
    • Level separation mismatch ratio (RLM)
  • Output voltage tests

    • Differential pk-pk (Tx enabled/disabled)
    • AC common-mode output voltage
    • DC common-mode output voltage
  • Output waveform measurements

    • Steady-state voltage, Vf
    • Linear fit pulse peak
    • Signal-to-noise-and-distortion ratio (SNDR)
    • Normalized coefficient step size
    • Full-scale range tests
  • Jitter measurements (using JP03A and JP03B patterns)

  • Return loss measurements using optional TDR or ENA/PNA