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V9071B GSM/EDGE/Evo Measurement Application for EXM and EXF

Product Status: Discontinued | Currently Supported
This product is no longer available

No replacement found for this product.

Key Features & Specifications


  • Fully compliant to the 3GPP standard
  • One-button, standards-based measurements with pass/fail tests
  • Superior measurement speed for wireless device manufacturing with multiple measurements from a single acquisition using the uplink EXM sequencer
  • Superior measurement speed for femtocell manufacturing with multiple measurements from a single acquisition using the EXF downlink sequencer

GSM/EDGE/EDGE Evo measurements

  • EXM for wireless user equipment (UE) test: EVM; phase and frequency error; ORFS; PvT; TX band spur and more
  • EXF for femtocell test: EVM; phase and frequency error; output RF spectrum (ORFS) for single carrier, multi-carrier and VAMOS enabled BTS; power vs. time (PvT); intermodulation products; TX band spur and more
  • Multi-Carrier BTS (MCBTS) and adaptive QPSK (AQPSK) modulated VAMOS1 measurements per 3GPP TS 45 standard

Access features

  • License key upgradeable
  • Fixed and transportable licenses available
  • SCPI remote user interface


The GSM/EDGE/Evo measurement application helps you easily achieve your manufacturing test goals for today’s multi-format devices or femtocells. It quickly performs standards-based measurements for compliance with the 3GPP standard. The EXM and EXF’s flexible sequencer uses single acquisition multiple measurement (SAMM) techniques to provide high-speed calibration and verification of your devices, modules or femtocells for maximum manufacturing throughput. Should issues arise, multiple color-coded result views help you quickly identify them for quick resolution. Using the GSM/EDGE/Evo measurement application with the EXM or EXF wireless test set makes it easy to rapidly ramp up and optimize full-volume manufacturing.