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T3111S NFC Conformance Test System

Product Status: Discontinued | Currently Supported
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T3100S Series NFC Test Systems - Technical Overview
This technical overview shows the elements and specifications that create the T3100S Series Test Systems for NFC testing during product development, R&D, pre-conformance and final certification.

Technical Overview 2016-04-13

EMV Level 1 Secure Payment Testing – FIME
EMV Level 1 Secure Payment Testing from FIME and Keysight.

Solution Brief 2014-08-04

Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29