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PNA 4-Ports, Dual-Source, Configurable Test Set, Extended Power Range (Option 419)

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Starting From US$ 159,963


Prices for: United States

* Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.

Key Features & Specifications

• Integrated 4-port network analysis and balanced measurements
• Internal dual-source for fast measurements of amplifier swept-IMD and mixer/converter fixed-IF measurements
• Reversible front panel jumpers for extended dynamic range configuration
• Configurable for high power measurements with external components
• The source step attenuators allow greater power range for amplifier measurements
• Bias-tees provide convenient DC bias to your amplifier
• The receiver step attenuators enable testing of high gain amplifiers


The 2-port test set with extended power range and bias-tee comes with internal dual-source, a configurable test set, source and receiver attenuators, and bias-tee at each port. For N5221A/2A, the source attenuators are 65 dB in 5 dB step and the receiver attenuators are 35 dB in 5 dB step. For N5224A/5A, the source attenuators are 60 dB in 10 dB step and the receiver attenuators are 35 dB in 5 dB step. For N5227A, both source and receiver attenuators are 50 dB in 10 dB step. The internal second source provides an additional signal (fixed or swept) for two-tone third-order-intercept (TOI) and intermodulation testing of amplifiers, or it can be used as a fast swept-LO signal for fixed-IF testing of mixers and converters. With two sources, source 1 is accessible through test ports 1 and 2, and source 2 is accessible through test ports 3 and 4. It also includes a solid-state internal RF transfer switch in the R1 reference-receiver path. Recommend Option 080.

The source step attenuators enable small test signal output for high gain amplifier testing. The receiver attenuators avoid receiver compression due to large signal incidents. Combine with the PNA for a flexible test set for amplifier measurements.