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IEEE 1149.6 Boundary Scan

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Key Features & Specifications

  • Compliant to IEEE 1149.1, 1149.6 standards
  • Performs the following tests:
    - Scan Path Integrity Test
    - Connect Test
    - Powered Shorts
    - Interconnect Test
    - Bus-Wire Test
    - Shorted Capacitors Test


The Institute of Electrical and Electronics Engineers (IEEE) release the IEEE 1149.6 standard to cater for AC-coupled signals. In a nutshell, IEEE 1149.1 for DC signals is what IEEE 1149.6 is for AC-coupled signals. This type of signal is typically denoted by a coupling capacitor in between driver and receiver.


In a topology such as these, the signal that passes through the capacitor and seen at the receiver RX will decay over time (Fig 1). The IEEE 1149.1 standard does not cater for decaying signals as the boundary register at the receiving end is not equipped to do so. This is what the IEEE1149.6 standard addresses and implementation on Keysight ICT testers extend the reach of boundary scan.

A greater advantage would be the ability to test non boundary scan nodes in tandem with boundary scan nodes and hence have a fuller test coverage on the board. Because of this “native-to-ICT” implementation, it delivers a more potent solution to the user.

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