Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

N7786B Benchtop Polarization Synthesizer

Sold By:

Configure

Prices for: United States

* Prices are subject to change without notice. Prices shown are Manufacturer's Suggested Retail Prices (MSRP). Prices shown are exclusive of taxes.

Refine the List

By Type of Content

1-8 of 8

Sort:
Measuring Polarization Dependent Loss of Passive Optical Components - Application Note
A new document on the methods of characterizing passive optical components.

Application Note 2017-12-01

PDF PDF 3.36 MB
Download the 2018 Lightwave Catalog
The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.

Catalog 2017-03-31

N778xB User Guide
This document is a user guide for the N778XB Keysight range of polarization test equipment.

User Manual 2015-08-01

PDF PDF 7.14 MB
N7786B Polarization Synthesizer - Data Sheet
This data sheet describes the N7786B Polarization Synthesizer. The N7786B contains a high-speed Lithium-Niobate based polarization controller and a polarization analyzer plus a microcontroller-based driving circuitry.

Data Sheet 2014-08-03

PDF PDF 580 KB
Measuring IL and PDL spectra with the fast-switching N7786B - Application Note
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.

Application Note 2014-07-31

PDF PDF 582 KB
Polarization-Resolved Measurements using Mueller Matrix Analysis - Application Note
Polarization-Resolved Measurements using Mueller Matrix Analysis - Application Note

Application Note 2014-07-31

PDF PDF 1 MB
Polarization Tutorial CD - Ordering Form
Polarization Tutorial CD - Ordering and Information Request Form.

Demo 2014-03-31

PMD Tolerance Testing of Optical Interfaces
This application note details the different setups focusing on PMD, with regards to improving test conditions and shortening the length of the testing time.

Application Note 2007-10-12