Integrated Photonics Test Products

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- English | 2019-09-19 |

Keysight provides test solutions for fast and efficient integrated and silicon photonics wafer and chip level test consisting of:

- Wavelength and polarization dependent optical and electro-optical measurements from 1240-1640nm with

- High frequency electro-optics measurements up to 110GHz with

- Wafer probing with FormFactor Silicon Photonics CM300xi probe station

- Test Automation with:

Test recipes ad measurement plan definition and execution with KS8400A Keysight Test Automation Platform (TAP)
Automated wafer probe station control with N7700210C Wafer Prober TAP Plug-In
Automated E/O and O/E LCA measurement with N4370P01A LCA TAP Plug-In

keysight-integrated-photonic

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