Integrated Photonics Test Products
Keysight provides test solutions for fast and efficient integrated and silicon photonics wafer and chip level test consisting of:
- Wavelength and polarization dependent optical and electro-optical measurements from 1240-1640nm with
- Photonic Application Suite
- Tunable Lasers
- Polarization Synthesizers
- Optical Power Meters and Source Measure Units (standalone and modular)
- Optical Signal Conditioning with Optical Switches and Attenuators
- High frequency electro-optics measurements up to 110GHz with
- Wafer probing with FormFactor Silicon Photonics CM300xi probe station
- Test Automation with:
- Test recipes ad measurement plan definition and execution with KS8400A Keysight Test Automation Platform (TAP)
- Automated wafer probe station control with N7700210C Wafer Prober TAP Plug-In
- Automated E/O and O/E LCA measurement with N4370P01A LCA TAP Plug-In
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KS8400A PathWave Test Automation
KS8400A PathWave Test Automation
- Powerful, flexible and extensible test sequencer software.
- Timing analyzer helps optimize test plan speed.
- Result Viewer helps visualize, compare and analyze test plan data
- Editor simplifies test plan creation and troubleshooting
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Photonic Application Suite
Photonic Application Suite
The Keysight Photonic Application Suite is a collection of advanced and basic software tools for automating optical measurements and analysis, especially for determining wavelength and polarization dependence of fiber optic network components.
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N4370P01A LCA TAP Plug-In
N4370P01A LCA TAP Plug-In
- Test steps for devices with either single-ended or balanced RF ports
- Clear step configurations for measurement settings, calibration and de-embedding
- Template for result display in TAP Result Viewer
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N7700210C Wafer Prober TAP Plug-In
N7700210C Wafer Prober TAP Plug-In
- Easily integrate wafer prober control within TAP test sequences
- Automated device stepping, optical and electrical probe positioning and alignment
- Supporting array / single fiber probes, edge and surface coupling, RF/DC probes
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