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Discontinued Atomic Force Microscopes and Scanning Electron Microscopes

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Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Application Note 2016-08-30

PDF PDF 2.89 MB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Data Sheet 2016-07-02

PDF PDF 2.89 MB
Keysight 7500 AFM Demo Video
This is a series of 8 informational AFM videos that takes the viewer from basic set-up of the instrument through modes to post-processing of your images.

How-To Video 2015-07-28

7500 Atomic Force Microscope (AFM) - Data Sheet

Data Sheet 2014-12-29

PDF PDF 4.40 MB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2014-12-16

PDF PDF 2.06 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Application Note 2014-12-15

PDF PDF 4.11 MB
Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Application Note 2014-09-04

PDF PDF 1.43 MB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 2.58 MB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Application Note 2013-11-21

PDF PDF 108 KB
High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 266 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 107 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Application Note 2013-09-27

PDF PDF 178 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 138 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 285 KB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 116 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 117 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 287 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 186 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 98 KB
EC-AFM: Engineered for Electrochemistry - Data Sheet

Data Sheet 2011-10-06

PDF PDF 411 KB
Scanning Microwave Microscopy (SMM) Mode - Data Sheet

Data Sheet 2008-08-26