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Discontinued Atomic Force Microscopes and Scanning Electron Microscopes

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Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Application Note 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Application Note 2014-12-10

PDF PDF 2.33 MB
How to choose your MAC Lever - Technical Overview

Technical Overview 2014-12-09

PDF PDF 168 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Application Note 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Application Note 2014-12-08

PDF PDF 742 KB
Scanning Microwave Microscope Mode - Application Note

Application Note 2014-12-04

PDF PDF 320 KB
Temperature Control - Data Sheet

Data Sheet 2014-11-17

PDF PDF 491 KB
Liquid Cell and Sample Plate - Data Sheet

Data Sheet 2014-11-06

PDF PDF 891 KB
PicoLITH, Keysight Lithography and Nanomanipulation Package – Data Sheet
Lithography and nanomanipulation software that provides for scanning probe microscopy (SPM) researchers. It allows users to sketch various shapes on a canvas (including lines, poly-lines, circles) that can then be mapped to a real sample surface.

Data Sheet 2014-11-03

PDF PDF 491 KB
MAC Mode - Data Sheet

Data Sheet 2014-11-03

PDF PDF 1.08 MB
Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Application Note 2014-09-04

PDF PDF 1.43 MB
7500 ILM Atomic Force Microscope (AFM) - Data Sheet
The 7500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope (AFM) with the direct optical viewing capability of an inverted optical microscope.

Data Sheet 2014-05-07

PDF PDF 135 KB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 2.58 MB
MAC Mode Imaging of Biological Molecules with 7500 AFM - Application Note

Application Note 2013-11-21

PDF PDF 108 KB
High Resolution Imaging with 7500 AFM - Application Note

Application Note 2013-10-24

PDF PDF 266 KB
Humidity-dependent AFM Nanolithography - Application Note

Application Note 2013-10-21

PDF PDF 107 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Application Note 2013-09-27

PDF PDF 178 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 138 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 285 KB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 116 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 117 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 287 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 186 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 98 KB

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