Automated ICT System
With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
- Smaller foot print to save production space
- Stable and robust usage to offer the best production uptime
- Highest test speed for best efficiency
- Seamless integration with best support availability
For more information about ICT system, please visit Keysight In-circuit test (ICT) Systems
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E9986E In-Line 4-Module In-Circuit Test System; i367x Series 5i
E9986E In-Line 4-Module In-Circuit Test System; i367x Series 5i
The Keysight i3070 Series 5i 4-module Inline ICT is the latest system in the i3070 Series 5i suite. Built with Keysight's proprietary short-wire fixturing technology, the 4-module inline is designed to handle large and heavy (up to 15kg) boards.
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E9988E In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E In-Line 2-Module In-Circuit Test System; i337x, Series 5i
- The E9988E offers max 2592 nodes testing. Built to stringent specifications for SMEMA compatibility, it is easily integrated into existing SMT lines.
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E9988EL In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL In-Line 2-Module In-Circuit Test System; i337x, Series 5i
- Short-wire fixturing technology ensures transportability, repeatability and stability
- Innovative design ensures easy maintenance and fixture change
- Compact chassis, only 800 mm or 31.5” in length
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U9405A Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
- The smallest foot print that meets your factory floor plans.
- Investment protection with upgradeable offline to inline feature.
- Best fit for automotive manufacturing with high component clearance.
- No more gray area between handler vendor and ICT vendors. Keysight gives you all.
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U9405B Keysight Flexicore i1000 Automated Inline Parallel In-Circuit Test System
U9405B Keysight Flexicore i1000 Automated Inline Parallel In-Circuit Test System
- Heterogeneous parallel test architecture, true 4-up parallel test
- Built-in Instrument Rack for functional test
- 850mm x 1100mm footprint