Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

WaferPro Express On-Wafer Measurement Program Software

WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

WaferPro Express is a key software component of Wafer-level Measurement Solutions (WMS), a joint partnership program by Keysight Technologies and Cascade Microtech. WMS products drastically reduce time to first measurement and provide accurate and repeatable device and component characterization. For more information, refer to Wafer-level Measurement Solutions – Cascade Microtech.

Key Benefits of WaferPro Express

  • Turnkey test algorithms and instrument drivers reduce the software learning curve and accelerate the process of setting up your measurement system and performing your first measurement.
  • A modern and intuitive user interface quickly enables you to connect to instruments and define a test plan. To further increase efficiency, the software integrates with Cascade Microtech Nucleus and WinCal XE software to enable seamless probe station control and automated RF calibration.
  • Exclusive integration with Cascade Microtech’s latest control software Velox 2. The new WaferSync interface between WaferPro Express and Velox enables complete wafer map synchronization and automated monitoring of the RF calibration during test plan execution.
  • Advanced tools such as Data Display, Wafer Mapping Data Viewer and the SQL database increase productivity when you need to efficiently handle high-volume data. In addition, the Python/PEL programming environment enables you to customize tests algorithms and the analysis of measured data.
  • WaferPro Express is now the official software platform for the Advanced Low-Frequency Noise Analyzer (A-LFNA). A-LFNA is a high-performance noise analyzer designed to make accurate and repeatable low frequency noise measurements.

Learn about WaferPro Express

1-25 of 43

Sort:
Introduction to Wafer-level Measurement Solutions (WMS) – WMS Series Part 1 of 6
In this video we present an overview of the hardware and software used for making wafer level measurements up to 110 GHz.This is part of a 6 part video series on wafer level measurements.

Demo 2018-05-09

Automated on-wafer millimeter wave measurements demo – WMS Series Part 2 of 6
In this demo, we measure S-parameters on a GaAs MESFET and capacitor structure in an automated fashion across the wafer. This leverages a lot of pieces together that will be explained in later videos: • configuring the WaferPro Express software to drive other instruments and wafer prober software • wafer alignment • RF S-parameter calibration • WaferPro Express project set up

Demo 2018-05-09

Configure WaferPro Express for measurements and probing – WMS Series Part 3 of 6
In this video, we will show you how to connect WaferPro Express to the instruments and then to the Velox prober control software.

Demo 2018-05-09

Set up a measurement project with WaferPro Express – WMS Series Part 6 of 6
In this video, we will set up a new project in WaferPro Express, defining our measurements on our desired devices.

Demo 2018-05-09

Perform on-wafer RF calibration – WMS Series Part 5 of 6
In this video, we demonstrate an on wafer network analyzer calibration to 50 GHz.

Demo 2018-05-09

Align wafer probes and create a wafer map – WMS Series Part 4 of 6
In this video, we demonstrate how to align a wafer to the reference plane of our probing system using the auto align feature in Velox. We will then generate a wafer map.

Demo 2018-05-09

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2018-03-05

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2018-03-01

PDF PDF 2.78 MB
Keysight Collaborates with Leading Research Centers to Reach Milestone in Low-Freq. Noise Measurment
Keysight announces it has reached a new milestone in low-frequency noise measurements through its work with leading research centers in Europe, Middle East, Africa and India (EMEAI). Using the new Advanced Low-Frequency Noise Analyzer (A-LFNA) and WaferPro Express software, designers can now measure noise more accurately in an even broader range of electronic devices.

Press Materials 2018-02-05

Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

Article 2017-05-31

Global Device Modeling Services - Brochure
Keysight Technologies' Device Modeling Services delivers accurate device parameters rapidly for your advanced devices.

Brochure 2017-03-16

PDF PDF 1.59 MB
Python Programming integration with IC-CAP
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

Keysight EEsof EDA Premier Communications Design Software
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2017-01-24

PDF PDF 2.54 MB
Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

Press Materials 2016-08-04

Low Frequency Noise Analyzer Technical Demo
A more technical dive on the new Advanced Low-Frequency Noise Analyzer with WaferPro Express, which offers the unique ability to measure and model device noise across wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-20

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

Press Materials 2016-07-19

Introducing the 2016 Advanced Low-Frequency Noise Analyzer
The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Demo 2016-07-18

WaferPro Express Support Home
WaferPro Express support home page in Keysight EEsof EDA Knowledge Center.

User Manual 2016-07-15

Follow Keysight EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2016-07-14

Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

Press Materials 2015-08-20

Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

Press Materials 2015-05-11

Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

Press Materials 2015-04-28

Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

Press Materials 2015-04-16

Keysight WaferPro Express
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

Product Tour 2015-03-24

1 2 Next