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Device Modeling and Characterization Products

Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight’s expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.

Key Benefits of Device Modeling Products

  • Integrated Circuit Characterization and Analysis Program (IC-CAP) is a versatile and user programmable industry standard for semiconductor device modeling
  • Model Builder Program (MBP) is a complete Silicon turnkey device modeling software
  • Model Quality Assurance (MQA) is the industry standard SPICE model signoff and acceptance software
  • WaferPro Express supports wafer-level measurement and programming test software for use with a variety of instruments and wafer probes.
  • Advanced Low-Frequency Noise Analyzer (A-LFNA) supports on-wafer measurement and analysis of flicker noise and random telegraph noise

Learn about Device Modeling and Characterization

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Configure WaferPro Express for measurements and probing – WMS Series Part 3 of 6
In this video, we will show you how to connect WaferPro Express to the instruments and then to the Velox prober control software.

Demo 2018-05-09

Align wafer probes and create a wafer map – WMS Series Part 4 of 6
In this video, we demonstrate how to align a wafer to the reference plane of our probing system using the auto align feature in Velox. We will then generate a wafer map.

Demo 2018-05-09

Perform on-wafer RF calibration – WMS Series Part 5 of 6
In this video, we demonstrate an on wafer network analyzer calibration to 50 GHz.

Demo 2018-05-09

Introduction to Wafer-level Measurement Solutions (WMS) – WMS Series Part 1 of 6
In this video we present an overview of the hardware and software used for making wafer level measurements up to 110 GHz.This is part of a 6 part video series on wafer level measurements.

Demo 2018-05-09

Set up a measurement project with WaferPro Express – WMS Series Part 6 of 6
In this video, we will set up a new project in WaferPro Express, defining our measurements on our desired devices.

Demo 2018-05-09

Automated on-wafer millimeter wave measurements demo – WMS Series Part 2 of 6
In this demo, we measure S-parameters on a GaAs MESFET and capacitor structure in an automated fashion across the wafer. This leverages a lot of pieces together that will be explained in later videos: • configuring the WaferPro Express software to drive other instruments and wafer prober software • wafer alignment • RF S-parameter calibration • WaferPro Express project set up

Demo 2018-05-09

IC-CAP 2018 Release Notes
IC-CAP 2018 Product Release Notes.

Release Notes 2018-04-30

Power Electronics Device Modeling
Power Electronics Model Generator (PEMG) software provides a comprehensive modeling solution for discrete power electronics devices, with an intuitive UI and the latest, most powerful models.

Technical Overview 2018-03-23

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2018-03-05

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2018-03-01

PDF PDF 2.78 MB
Keysight Collaborates with Leading Research Centers to Reach Milestone in Low-Freq. Noise Measurment
Keysight announces it has reached a new milestone in low-frequency noise measurements through its work with leading research centers in Europe, Middle East, Africa and India (EMEAI). Using the new Advanced Low-Frequency Noise Analyzer (A-LFNA) and WaferPro Express software, designers can now measure noise more accurately in an even broader range of electronic devices.

Press Materials 2018-02-05

E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

Data Sheet 2017-12-01

IMECAS uses MBP to Create a PDSOI PN Junction Model
Researchers from the Institute of Microelectronics of Chinese Academy of Sciences (IMECAS) have proposed a new simulation model for the PN junction based on SOI.

Case Study 2017-11-01

PDF PDF 391 KB
Hangzhou Dianzi University Uses IC-CAP to Extract a Novel, Small-Signal Model for Bulk FinFETs
Case study on how Hangzhou Dianzi University created a novel compact model for bulk FinFETs that accommodates self-heating behaviors.

Case Study 2017-10-10

PDF PDF 1.12 MB
Customizing Tables Just Got Easier with a New Python Module for MQA Software
Working with data tables is a basic skill every engineer learns early on in their career. When organized properly, tables can summarize a great deal of device data into a helpful information format, and that makes them extremely useful.

Article 2017-07-12

How to Simplify Device Model Extraction using an Open Source User Interface
This video shows an example of an IC-CAP custom user interface (UI) for device modeling. In the selected modeling application, the DC modeling of a Zener diode is intentionally kept simple in order to demonstrate the features of the UI.

How-To Video 2017-06-26

Static Random Access Memory (SRAM) Cell Modeling in MBP 2017
This video introduces a new turnkey solution for SRAM modeling now available in Keysight’s Model Builder Program 2017. The video describes the concept of SRAM cell modeling and highlights the major challenges of that process.

Demo 2017-06-12

Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

Article 2017-05-31

How to Extract a BSIM4 DC Model
This video introduces a general DC modeling and characterization flow for the BSIM4 model, which is one of the most popular models used by the industry today for bulk CMOS.

How-To Video 2017-05-24

SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

MBP 2017 Documentation
Model Builder Program (MBP) 2017 Product Documentation

Reference Guide 2017-04-28

MQA 2017 Documentation
Model Quality Assurance (MQA) 2017 Product Documentation.

Reference Guide 2017-04-28

MQA 2017 Release Notes
Model Quality Assurance (MQA) 2017 product release notes.

Release Notes 2017-04-28

MBP 2017 Release Notes
Model Builder Program (MBP) 2017 product release notes.

Release Notes 2017-04-28

Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2017-04-27

PDF PDF 907 KB

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